Invention Grant
- Patent Title: Detection of contamination at sensor contacts
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Application No.: US13447152Application Date: 2012-04-13
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Publication No.: US09936903B2Publication Date: 2018-04-10
- Inventor: Igor Gofman , Mu Wu
- Applicant: Igor Gofman , Mu Wu
- Assignee: WaveForm Technologies, Inc.
- Current Assignee: WaveForm Technologies, Inc.
- Agency: Schwabe, Williamson & Wyatt, P.C.
- Main IPC: G01N31/00
- IPC: G01N31/00 ; A61B5/145 ; A61B5/1486

Abstract:
Embodiments herein provide detection of contamination at one or more contacts of a sensor system. The sensor system includes a sensor assembly and an electronics assembly communicatively coupled together by one or more contacts. The sensor assembly passes a sensor signal to the electronics assembly for further processing. The electronics assembly includes a detection contact for detecting contamination on or near one or more contacts of the sensor assembly and/or the electronics assembly. A switch selectively couples the detection contact to a bias voltage during a measurement mode and to a reference voltage during a detection mode, the reference voltage being different from the bias voltage. A method of contamination detection includes switching the electronics assembly between the measurement mode and the detection mode, and monitoring for a change in the output signal received by the electronics assembly.
Public/Granted literature
- US20130018597A1 DETECTION OF CONTAMINATION AT SENSOR CONTACTS Public/Granted day:2013-01-17
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