Invention Grant
- Patent Title: MEMS device structure with a capping structure
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Application No.: US15436943Application Date: 2017-02-20
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Publication No.: US09938138B2Publication Date: 2018-04-10
- Inventor: Chun-Wen Cheng , Chia-Hua Chu
- Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.
- Applicant Address: TW Hsin-Chu
- Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- Current Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
- Current Assignee Address: TW Hsin-Chu
- Agency: Haynes and Boone, LLP
- Main IPC: B81C1/00
- IPC: B81C1/00 ; B81B7/00

Abstract:
An integrated circuit device includes a dielectric layer disposed over a semiconductor substrate, the dielectric layer having a sacrificial cavity formed therein, a membrane layer formed onto the dielectric layer, and a capping structure formed on the membrane layer such that a second cavity is formed, the second cavity being connected to the sacrificial cavity through a via formed into the membrane layer.
Public/Granted literature
- US20170158494A1 MEMS Device Structure with a Capping Structure Public/Granted day:2017-06-08
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