Invention Grant
- Patent Title: Demodulation of intensity modulation in X-ray imaging
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Application No.: US15021675Application Date: 2014-09-11
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Publication No.: US09939392B2Publication Date: 2018-04-10
- Inventor: Han Wen , Houxun Miao
- Applicant: The United States of America, as Represented by the Secretary, Department of Health and Human Services
- Applicant Address: US DC Washington
- Assignee: The United States of America, as represented by the Secretary, Department of Health and Human Services
- Current Assignee: The United States of America, as represented by the Secretary, Department of Health and Human Services
- Current Assignee Address: US DC Washington
- Agency: Klarquist Sparkman, LLP
- International Application: PCT/US2014/055224 WO 20140911
- International Announcement: WO2015/038793 WO 20150319
- Main IPC: G01N23/04
- IPC: G01N23/04
Abstract:
X-ray grating based and grid based imagers formed a fringe pattern modulated by a specimen. An X-ray beam is scanned so that the fringe pattern is modulated by these specimen along a plurality of projection directions. Corresponding fringe patterns are detected and aligned so as to produce a specimen phase image. X-ray beam scanning is based on electric or magnetic deflection of an electron beam to an X-ray generating target.
Public/Granted literature
- US20160231258A1 DEMODULATION OF INTENSITY MODULATION IN X-RAY IMAGING Public/Granted day:2016-08-11
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