Invention Grant
- Patent Title: Anomaly detecting method, and apparatus for the same
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Application No.: US14568268Application Date: 2014-12-12
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Publication No.: US09940184B2Publication Date: 2018-04-10
- Inventor: Hisae Shibuya
- Applicant: Hitachi High-Technologies Corporation , Hitachi Power Solutions Co., Ltd.
- Applicant Address: JP Tokyo JP Ibaraki
- Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION,HITACHI POWER SOLUTIONS CO., LTD.
- Current Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION,HITACHI POWER SOLUTIONS CO., LTD.
- Current Assignee Address: JP Tokyo JP Ibaraki
- Agency: Baker Botts L.L.P.
- Priority: JP2013-258215 20131213
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G05B23/02 ; G06N99/00

Abstract:
In an anomaly detecting method by using multi-dimensional time series sensor signals including, generating anomaly model by using data of a learning period including neither that period nor any exclusion candidate period, calculating anomaly measurements on the basis of the distance from the normal model and, making a period containing the maximum anomaly measurement value but no exclusion candidate period, learning exclusion periods and anomaly determining thresholds are determined as learned data on the basis of the result in each round, generates anomaly model data in a learning period except learning-exclusion periods regarding acquired data or data in a designated evaluation period, an anomaly measurement at each time point is calculated on the basis of the distance from the normal model, and data at each time point is determined to be anomaly or normal by comparing the anomaly measurements with anomaly determining thresholds.
Public/Granted literature
- US20150169393A1 ANOMALY DETECTING METHOD, AND APPARATUS FOR THE SAME Public/Granted day:2015-06-18
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