Invention Grant
- Patent Title: Method of manufacturing semiconductor device and semiconductor device
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Application No.: US13980435Application Date: 2012-11-28
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Publication No.: US09941112B2Publication Date: 2018-04-10
- Inventor: Atsushi Ogasawara , Koji Ito , Kazuhiko Ito , Koya Muyari
- Applicant: SHINDENGEN ELECTRIC MANUFACTURING CO., LTD.
- Applicant Address: JP Tokyo
- Assignee: SHINDENGEN ELECTRIC MANUFACTURING CO., LTD
- Current Assignee: SHINDENGEN ELECTRIC MANUFACTURING CO., LTD
- Current Assignee Address: JP Tokyo
- Agency: Hauptman Ham, LLP
- Priority: WOPCT/JP2012/061779 20120508; WOPCT/JP2012/061780 20120508
- International Application: PCT/JP2012/080795 WO 20121128
- International Announcement: WO2013/168314 WO 20131114
- Main IPC: H01L21/02
- IPC: H01L21/02 ; C03C3/066 ; C03C3/093 ; C03C8/04 ; C03C8/24 ; H01L29/861 ; H01L29/06 ; H01L23/29 ; H01L23/31 ; H01L21/762 ; H01L23/00

Abstract:
Provided is a method of manufacturing a semiconductor device which includes, in the following order: a first step of preparing a semiconductor element which includes a pn junction exposure portion; a second step of forming an insulation layer such that the insulation layer covers the pn junction exposure portion; and a third step of forming a glass layer on the insulation layer where a layer made of glass composition for protecting a semiconductor junction is formed on the insulation layer and, thereafter, the layer made of glass composition for protecting a semiconductor junction is baked.
Public/Granted literature
- US20140312472A1 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE Public/Granted day:2014-10-23
Information query
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