Invention Grant
- Patent Title: Silicon-based quantum dot device
-
Application No.: US15442113Application Date: 2017-02-24
-
Publication No.: US09941430B2Publication Date: 2018-04-10
- Inventor: Aleksey Andreev , David Williams , Ryuta Tsuchiya , Yuji Suwa
- Applicant: HITACHI, LTD.
- Applicant Address: JP Tokyo
- Assignee: HITACHI, LTD.
- Current Assignee: HITACHI, LTD.
- Current Assignee Address: JP Tokyo
- Agency: Miles & Stockbridge P.C.
- Priority: EP16163414 20160331
- Main IPC: H01L29/06
- IPC: H01L29/06 ; H01L31/0352 ; H01L31/028 ; H01L31/024 ; H01L33/06 ; H01L33/34 ; H01L33/64 ; H01L31/112 ; H01L33/00 ; G06N99/00 ; B82Y10/00 ; B82Y20/00

Abstract:
A silicon-based quantum dot device (1) is disclosed. The device comprises a substrate (8) and a layer (7) of silicon or silicon-germanium supported on the substrate which is configured to provide at least one quantum dot (51, 52: FIG. 5). The layer of silicon or silicon-germanium has a thickness of no more than ten monolayers. The layer of silicon or silicon-germanium may have a thickness of no more than eight or five monolayers.
Public/Granted literature
- US20170288076A1 SILICON-BASED QUANTUM DOT DEVICE Public/Granted day:2017-10-05
Information query
IPC分类: