Invention Grant
- Patent Title: Fin field-effect transistor gated diode
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Application No.: US15122379Application Date: 2015-05-25
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Publication No.: US09947659B2Publication Date: 2018-04-17
- Inventor: Chang-Tzu Wang , Bo-Shih Huang
- Applicant: MediaTek Inc.
- Applicant Address: TW Hsin-Chu
- Assignee: MEDIATEK INC.
- Current Assignee: MEDIATEK INC.
- Current Assignee Address: TW Hsin-Chu
- Agency: McClure, Qualey & Rodack, LLP
- International Application: PCT/CN2015/079658 WO 20150525
- International Announcement: WO2015/180595 WO 20151203
- Main IPC: H01L27/02
- IPC: H01L27/02 ; H01L27/088 ; H01L29/78 ; H01L23/535

Abstract:
The invention provides a semiconductor device. The semiconductor device includes a fin field effect transistor (finFET) array including finFET units. Each of the finFET units includes a substrate having a fin along a first direction. A first metal strip pattern and a second metal strip pattern are formed on the fin, extending along a second direction that is different from the first direction. The first and second metal strip patterns are conformally formed on opposite sidewalls and a top surface of the fin, respectively. A first contact and a second contact are formed on the fin. The first and second metal strip patterns are disposed between the first and second contacts. A first dummy contact is formed on the fin, sandwiched between the first and second metal strip patterns.
Public/Granted literature
- US20160372468A1 FIN FIELD-EFFECT TRANSISTOR GATED DIODE Public/Granted day:2016-12-22
Information query
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