Invention Grant
- Patent Title: Systems and methods for measuring entrained vapor
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Application No.: US14872239Application Date: 2015-10-01
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Publication No.: US09951423B2Publication Date: 2018-04-24
- Inventor: Eric H. Lenz
- Applicant: Lam Research Corporation
- Applicant Address: US CA Fremont
- Assignee: LAM RESEARCH CORPORATION
- Current Assignee: LAM RESEARCH CORPORATION
- Current Assignee Address: US CA Fremont
- Main IPC: C23C16/52
- IPC: C23C16/52 ; C23C16/455 ; G05D7/06 ; C23C16/448

Abstract:
A system for supplying precursor gas to a substrate processing chamber includes a first mass flow controller including an inlet to receive a carrier gas and an outlet. An ampoule is configured to supply a precursor gas. A valve system, in fluid communication with the first mass flow controller and the ampoule, is configured to supply the precursor gas and the carrier gas to a momentum-based flow restriction member. A pressure sensing system is configured to sense an inlet pressure at an inlet of the momentum-based flow restriction member and an outlet pressure at an outlet of the momentum-based flow restriction member. A controller is configured to determine a flow rate of the precursor gas at the outlet of the momentum-based flow restriction member based on a difference between the inlet pressure and the outlet pressure.
Public/Granted literature
- US20160097127A1 SYSTEMS AND METHODS FOR MEASURING ENTRAINED VAPOR Public/Granted day:2016-04-07
Information query
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