The invention relates to a device for measuring the scattering of a sample. Said device includes at least one first and one second scattering receiver for capturing scattered rays from the sample; and at least one imaging element via which rays can reach the sample and from the sample to the scattering receiver. According to the invention, the first and second scattering receivers are arranged in a common flat or approximately spherically curved surface, which is oriented perpendicular to an optical axis of the imaging element. The first scattering receiver is designed and arranged to capture saturated scattered rays from the sample and the second scattering receiver is designed and arranged to capture linearly scattered rays from the sample.