Invention Grant
- Patent Title: Method for polishing silicon wafer
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Application No.: US15506431Application Date: 2015-05-13
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Publication No.: US09956663B2Publication Date: 2018-05-01
- Inventor: Kazuaki Kozasa , Katsuhisa Sugimori , Syunya Kobuchi
- Applicant: SUMCO CORPORATION
- Applicant Address: JP Tokyo
- Assignee: SUMCO CORPORATION
- Current Assignee: SUMCO CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Greenblum & Bernstein, P.L.C.
- Priority: JP2014-175330 20140829
- International Application: PCT/JP2015/063824 WO 20150513
- International Announcement: WO2016/031310 WO 20160303
- Main IPC: B24B37/24
- IPC: B24B37/24 ; B24B37/10 ; H01L21/306

Abstract:
A method of a polishing a wafer includes: a first polishing step of polishing a surface of the wafer while supplying a rough polishing liquid onto a polishing surface of a rough polishing cloth; subsequent to the first polishing step, a protection film formation step of supplying a protection film formation solution containing a water-soluble polymer to the rough polishing cloth after being used in the first polishing step and bringing the protection film formation solution into contact with the polished surface of the wafer to form a protection film on the polished surface; and a second polishing step of polishing the surface of the wafer where the protection film is formed while supplying a finish polishing liquid to a polishing surface of a finish polishing cloth different from the rough polishing cloth.
Public/Granted literature
- US20170252891A1 METHOD FOR POLISHING SILICON WAFER Public/Granted day:2017-09-07
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