Invention Grant
- Patent Title: Single crystal diamond and diamond tool
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Application No.: US14413175Application Date: 2014-04-16
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Publication No.: US09957640B2Publication Date: 2018-05-01
- Inventor: Yoshiki Nishibayashi , Akihiko Ueda , Hitoshi Sumiya , Yutaka Kobayashi , Yuichiro Seki , Toshiya Takahashi
- Applicant: Sumitomo Electric Industries, Ltd. , SUMITOMO ELECTRIC HARDMETAL CORP.
- Applicant Address: JP Osaka-shi JP Itami-shi
- Assignee: Sumitomo Electric Industries, Ltd.,Sumitomo Electric Hardmetal Corp.
- Current Assignee: Sumitomo Electric Industries, Ltd.,Sumitomo Electric Hardmetal Corp.
- Current Assignee Address: JP Osaka-shi JP Itami-shi
- Agency: Venable LLP
- Agent Michael A. Sartori; Kerri M. Patterson
- Priority: JP2013-095362 20130430
- International Application: PCT/JP2014/060795 WO 20140416
- International Announcement: WO2014/178281 WO 20141106
- Main IPC: C30B29/04
- IPC: C30B29/04 ; C30B25/18 ; C30B25/20 ; C01B32/25

Abstract:
A single crystal diamond has a surface. In the single crystal diamond, a measurement region is defined in the surface, the measurement region includes a portion exhibiting a transmittance that is highest in the single crystal diamond and a portion exhibiting a transmittance that is lowest in the single crystal diamond, the measurement region has a plurality of square regions that are continuously arranged and each have a side having a length of 0.2 mm, and an average value of transmittances in each of the plurality of square regions is measured, wherein assuming that the average value of the transmittances in one square region is defined as T1 and the average value of the transmittances in another square region adjacent to the one square region is defined as T2, a relation of ((T1−T2)/((T1+T2)/2)×100)/0.2≤20 (%/mm) is satisfied throughout the measurement region.
Public/Granted literature
- US20150176156A1 SINGLE CRYSTAL DIAMOND AND DIAMOND TOOL Public/Granted day:2015-06-25
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