Invention Grant
- Patent Title: High spot material gauging device
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Application No.: US15203933Application Date: 2016-07-07
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Publication No.: US09958248B2Publication Date: 2018-05-01
- Inventor: Rolf G. Laemmer
- Applicant: Rolf G. Laemmer
- Main IPC: G01B3/30
- IPC: G01B3/30 ; G01B5/06 ; G01B1/00 ; G01B5/14 ; G01B5/28

Abstract:
A high spot material gauging device applies high spot detection material in multiple depths to provide a basis for correctly determining a depth of material to be removed to produce a planar surface. The device includes a block having a planar first face. Each of a plurality of channels extends into the first face of the block. Each channel has a planar bottom surface parallel to the face of the block. The bottom surface of each channel is a unique respective depth measured transversely from the face of the block such that each channel is configured for applying a unique thickness of high spot material onto a planar control surface.
Public/Granted literature
- US20160313111A1 HIGH SPOT MATERIAL GAUGING DEVICE Public/Granted day:2016-10-27
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