Invention Grant
- Patent Title: System for measuring three-dimensional profile of transparent object or refractive index by fringe projection
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Application No.: US14833174Application Date: 2015-08-24
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Publication No.: US09958262B2Publication Date: 2018-05-01
- Inventor: Wei-Hung Su , Chau-Jern Cheng , Guang-Hong Chen
- Applicant: National Sun Yat-sen University
- Applicant Address: TW Kaohsiung
- Assignee: NATIONAL SUN YAT-SEN UNIVERSITY
- Current Assignee: NATIONAL SUN YAT-SEN UNIVERSITY
- Current Assignee Address: TW Kaohsiung
- Agency: Soroker Agmon Nordman
- Priority: TW104105692A 20150217
- Main IPC: G01B11/25
- IPC: G01B11/25 ; G01N21/958

Abstract:
A system for measuring the profile or the refractive index of a transparent object by fringe projection techniques is provided and has an image generating device, an image capture device, and an image processor. The image generating device produces a reference image with a long depth of focus. This reference image is emitted into an inspected transparent object, and is distorted by the refractive index and the profile of the transparent object. The image capture device receives the distorted image. The image processor analyzes the difference between the distorted image and the reference image, so as to identify the profile or the refractive index of the inspected transparent object.
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