Invention Grant
- Patent Title: Apparatus and method for evaluation of optical elements
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Application No.: US15154454Application Date: 2016-05-13
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Publication No.: US09958355B2Publication Date: 2018-05-01
- Inventor: Filipp V. Ignatovich , Donald S. Gibson , Michael A. Marcus
- Applicant: LUMETRICS, INC.
- Applicant Address: US NY Rochester
- Assignee: Lumetrics, Inc.
- Current Assignee: Lumetrics, Inc.
- Current Assignee Address: US NY Rochester
- Agency: Patent Innovations LLC
- Agent John M. Hammond
- Main IPC: G01B9/00
- IPC: G01B9/00 ; G01M11/02

Abstract:
An apparatus for measuring the optical performance characteristics and dimensions of an optical element comprising a low coherence interferometer and a Shack-Hartmann wavefront sensor comprising a light source, a plurality of lenslets, and a sensor array is disclosed. The low coherence interferometer is configured to direct a measurement beam along a central axis of the optical element, and to measure the thickness of the center of the optical element. The light source of the Shack-Hartmann wavefront sensor is configured to emit a waveform directed parallel to and surrounding the measurement beam of the interferometer, through the plurality of lenslets, and to the sensor array. A method for measuring the optical performance characteristics and dimensions of a lens using the apparatus is also disclosed.
Public/Granted literature
- US20160252425A1 APPARATUS AND METHOD FOR EVALUATION OF OPTICAL ELEMENTS Public/Granted day:2016-09-01
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