Invention Grant
- Patent Title: Biaxial measuring device and method for determining normal and shear stress-correlated material parameters
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Application No.: US15505929Application Date: 2015-07-24
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Publication No.: US09958365B2Publication Date: 2018-05-01
- Inventor: Kai Heinlein , Arnold Mager , Rosemarie Wagner
- Applicant: Karlsruher Institut fuer Technologie
- Applicant Address: DE Karlsruhe
- Assignee: KARLSRUHER INSTITUT FUER TECHNOLOGIE
- Current Assignee: KARLSRUHER INSTITUT FUER TECHNOLOGIE
- Current Assignee Address: DE Karlsruhe
- Agency: Leydig, Voit & Mayer, Ltd.
- Priority: DE102014112161 20140826
- International Application: PCT/EP2015/001532 WO 20150724
- International Announcement: WO2016/029985 WO 20160303
- Main IPC: G01N3/08
- IPC: G01N3/08 ; G01N3/06 ; G01N3/24

Abstract:
A method for determining material parameters includes applying a character grid over a planar sample, clamping the planar sample in a frame in accordance with directions of orthotropy of the planar sample; collecting a first set of data that describes a first position of the character grid; applying predetermined normal and shear stresses to the planar sample thereby bringing the planar sample into a deformed state and changing the position of the character grid; collecting a second set of data that describes a second position of the character grid, determining a relative position change of the character grid by correlating the collected first set of data and the second set of data; determining a relative displacement and a current distortion state of the planar sample; determining a deformation equilibrium of the deformed state of the planar sample; and calculating the material parameters from the deformation equilibrium.
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