Invention Grant
- Patent Title: Test device and test method using the same
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Application No.: US15308108Application Date: 2016-02-25
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Publication No.: US09958475B2Publication Date: 2018-05-01
- Inventor: Guiyun Wang , Xuefeng Li
- Applicant: BOE TECHNOLOGY GROUP CO., LTD. , BOE (HEBEI) MOBILE DISPLAY TECHNOLOGY CO., LTD.
- Applicant Address: CN CN
- Assignee: BOE TECHNOLOGY GROUP CO., LTD.,BOE (HEBEI) MOBILE DISPLAY TECHNOLOGY CO., LTD.
- Current Assignee: BOE TECHNOLOGY GROUP CO., LTD.,BOE (HEBEI) MOBILE DISPLAY TECHNOLOGY CO., LTD.
- Current Assignee Address: CN CN
- Agency: Brooks Kushman P.C.
- Priority: CN201510562926 20150907
- International Application: PCT/CN2016/074508 WO 20160225
- International Announcement: WO2017/041449 WO 20170316
- Main IPC: G01R31/00
- IPC: G01R31/00 ; G01R1/04 ; G06F3/041 ; G06F3/044 ; G01R1/073 ; G01R31/26 ; G01R31/28

Abstract:
The present disclosure provides a test device and a test method using the test device. The test device includes a first fastener structure for fastening a to-be-tested substrate with first touch lines, a second fastener structure for fastening a test match panel with second touch lines, and the first touch lines and the second touch lines forming a touch module, a third fastener structure for supporting a change-over flexible printed circuit board, a signal input structure for electrically connecting to one of a circuit board in the test match panel and the first touch lines through the change-over flexible printed circuit board, and inputting trigger data signals, a sensing signal capture structure for capturing touch sensing signals in the first touch line or the second touch lines.
Public/Granted literature
- US20170269124A1 TEST DEVICE AND TEST METHOD USING THE SAME Public/Granted day:2017-09-21
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