Invention Grant
- Patent Title: Magnetic field measurement apparatus, magnetic field measurement system and magnetic field measurement method
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Application No.: US14602635Application Date: 2015-01-22
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Publication No.: US09958514B2Publication Date: 2018-05-01
- Inventor: Ryuji Hokari
- Applicant: Seiko Epson Corporation
- Applicant Address: JP
- Assignee: Seiko Epson Corporation
- Current Assignee: Seiko Epson Corporation
- Current Assignee Address: JP
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: JP2011-081807 20110401
- Main IPC: G01R33/26
- IPC: G01R33/26 ; G01R33/032

Abstract:
A magnetic field measurement apparatus includes a first gas cell disposed in a +z direction when seen from an object to be measured, a second gas cell disposed in the +z direction when seen from the first gas cell, a first measurement unit which measures a component of a magnetic field in the first gas cell, a second measurement unit which measures a component of a magnetic field in the second gas cell, a magnetic field generation unit which generates the magnetic field toward the second gas cell so as to reduce the component measured by the second measurement unit, and an output unit which outputs a signal in response to the difference in the components respectively measured by the first measurement unit and second measurement unit.
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