Invention Grant
- Patent Title: Probe calibration devices and methods
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Application No.: US14737229Application Date: 2015-06-11
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Publication No.: US09958524B2Publication Date: 2018-05-01
- Inventor: Lydell L. Frasch , Nathaniel P. Roman
- Applicant: The Boeing Company
- Applicant Address: US IL Chicago
- Assignee: THE BOEING COMPANY
- Current Assignee: THE BOEING COMPANY
- Current Assignee Address: US IL Chicago
- Agency: Toler Law Group, P.C.
- Main IPC: G01R35/00
- IPC: G01R35/00 ; G01R27/06 ; H01P5/08 ; G01R3/00 ; G01R23/165 ; G01B21/04 ; G01B7/06 ; G01N22/00 ; G01R23/07

Abstract:
A probe calibration device that includes a first offset element having a substantially rectangular first aperture. The probe calibration device includes a tuned pass element disposed adjacent to the first offset element. The tuned pass element has a non-rectangular second aperture. The probe calibration device includes a second offset element disposed adjacent to the tuned pass element and on a side opposite the first offset element. The second offset element has a substantially rectangular third aperture. The probe calibration device includes a backing element disposed adjacent to the second offset element. The first offset element, the tuned pass element, the second offset element and the backing element form a cavity.
Public/Granted literature
- US20170082719A1 PROBE CALIBRATION DEVICES AND METHODS Public/Granted day:2017-03-23
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