Invention Grant
- Patent Title: Assisting failure diagnosis in a system
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Application No.: US12937490Application Date: 2009-04-17
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Publication No.: US09959153B2Publication Date: 2018-05-01
- Inventor: Richard Lee Bovey
- Applicant: Richard Lee Bovey
- Applicant Address: GB London
- Assignee: BAE Systems plc
- Current Assignee: BAE Systems plc
- Current Assignee Address: GB London
- Agency: Maine Cernota & Rardin
- Priority: EP08007614 20080418; GB0807077.3 20080418
- International Application: PCT/GB2009/050384 WO 20090417
- International Announcement: WO2009/136183 WO 20091112
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06Q10/06

Abstract:
A method of assisting failure diagnosis in a system includes obtaining data including a probabilistic Bayesian Network describing a set of failures, a set of symptoms and probabilities of at least some of the symptoms being associated with at least some of the failures in a system. A cost value representing a cost associated with learning of a presence or absence of the symptom is obtained for at least some of the symptoms, as well as a plurality of information values, e.g. values representing measures of information gained by learning of the presence or absence of the symptom in relation to a respective plurality of the failures, associated with the symptom. The method then computes an information-for-cost value for the symptom based on the cost value and the plurality of information values.
Public/Granted literature
- US20110099039A1 ASSISTING FAILURE DIAGNOSIS IN A SYSTEM Public/Granted day:2011-04-28
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