Invention Grant
- Patent Title: Apparatus, method and program for 3D data analysis, and microparticle analysis system
-
Application No.: US15644042Application Date: 2017-07-07
-
Publication No.: US09959450B2Publication Date: 2018-05-01
- Inventor: Shunsuke Suzuki , Ryo Fukazawa , Atsuo Fujimaki , Wataru Hashimoto
- Applicant: Sony Corporation
- Applicant Address: JP Tokyo
- Assignee: Sony Corporation
- Current Assignee: Sony Corporation
- Current Assignee Address: JP Tokyo
- Agency: K&L Gates LLP
- Priority: JP2011-226675 20111014
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06T19/00

Abstract:
In an example embodiment, may be embodied in a data analysis apparatus comprises a control unit configured to provide data representative of a three dimensional image, the three dimensional image including at least a three dimensional coordinate space which includes at least one plane that divides the three dimensional coordinate space into at least two regions, a display unit configured to produce the three dimensional image based on the data representative of the three dimensional image, and an input unit configured to provide data representative of at least one of a movement and a position of the at least one plane. In other example embodiments, the present disclosure may be embodied in a data analysis server, a data analysis system, and/or a computer readable medium.
Public/Granted literature
- US20180012063A1 APPARATUS, METHOD AND PROGRAM FOR 3D DATA ANALYSIS, AND MICROPARTICLE ANALYSIS SYSTEM Public/Granted day:2018-01-11
Information query