Invention Grant
- Patent Title: Estimation apparatus and method for a nonlinear characteristic
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Application No.: US15086865Application Date: 2016-03-31
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Publication No.: US09960863B2Publication Date: 2018-05-01
- Inventor: Hao Chen , Lei Li , Zhenning Tao
- Applicant: FUJITSU LIMITED
- Applicant Address: JP Kawasaki
- Assignee: FUJITSU LIMITED
- Current Assignee: FUJITSU LIMITED
- Current Assignee Address: JP Kawasaki
- Agency: Staas & Halsey LLP
- Priority: CN201510147371 20150331
- Main IPC: H04B1/38
- IPC: H04B1/38 ; H04B15/00 ; H03K5/01 ; H04B1/10 ; H04B17/13 ; H04B17/309

Abstract:
Embodiments of the present disclosure provide an estimation apparatus and method for a nonlinear characteristic, which may simply and quickly estimate the nonlinear characteristic of a system to be measured by calculating parameters of the nonlinear model of the system to be measured according to the fundamental power and harmonic power of output signals of the system to be measured on at least two frequency spots obtained through measurement, with the accuracy of the result of estimation being relatively high.
Public/Granted literature
- US20160294489A1 ESTIMATION APPARATUS AND METHOD FOR A NONLINEAR CHARACTERISTIC Public/Granted day:2016-10-06
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