Invention Grant
- Patent Title: Image sensor pixel noise measurement
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Application No.: US15179648Application Date: 2016-06-10
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Publication No.: US09961281B2Publication Date: 2018-05-01
- Inventor: Bi Yuan , Liping Deng , Yingkan Lin , Liang Zuo , Yuxin Wang
- Applicant: OMNIVISION TECHNOLOGIES, INC.
- Applicant Address: US CA Santa Clara
- Assignee: OmniVision Technologies, Inc.
- Current Assignee: OmniVision Technologies, Inc.
- Current Assignee Address: US CA Santa Clara
- Agency: Johnson Kindness PLLC
- Agent Christensen O'Connor
- Main IPC: H04N5/357
- IPC: H04N5/357 ; H04N5/378

Abstract:
An image sensor pixel noise measurement circuit includes a pixel array on an integrated circuit chip. The pixel array includes a plurality of pixels including a first pixel to output a first image data signal, and a second pixel to output a second image data signal. A noise amplification circuit on the integrated circuit chip is coupled to receive the first and second image data signals from the pixel array. The noise amplification circuit is coupled to output an amplified differential noise signal in response to the first and second image data signals received from the pixel array. A fast Fourier transform (FFT) analysis circuit on the integrated circuit chip is coupled to transform the amplified differential noise signal output by the noise amplification circuit from a time domain to a frequency domain to analyze a pixel noise characteristic of the pixel array.
Public/Granted literature
- US20170359532A1 IMAGE SENSOR PIXEL NOISE MEASUREMENT Public/Granted day:2017-12-14
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