Invention Grant
- Patent Title: Imaging spectrometer design tool for evaluating freeform optics
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Application No.: US15168015Application Date: 2016-05-28
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Publication No.: US09964444B2Publication Date: 2018-05-08
- Inventor: Jannick P. Rolland , Jacob Reimers
- Applicant: Jannick P. Rolland , Jacob Reimers
- Applicant Address: US NY Rochester
- Assignee: UNIVERSITY OF ROCHESTER
- Current Assignee: UNIVERSITY OF ROCHESTER
- Current Assignee Address: US NY Rochester
- Agency: Harter Secrest & Emery LLP
- Agent Thomas B. Ryan
- Main IPC: G06T11/20
- IPC: G06T11/20 ; G01J3/28

Abstract:
A full-field display for spectrally dispersive imaging optics, particularly as a design tool for evaluating optical designs including designs with freeform optical surfaces, includes a ray tracing module arranged for modeling local aberrations throughout the image field of the spectrometer and a display module that converts values of the modeled local aberrations throughout the image field into representative symbols. The spectrometer field has a first spatial dimension corresponding to a length dimension of an input and a second spectral dimension corresponding to the dispersion of the input. The representative symbols are plotted in an array having a first axis corresponding to the first spatial dimension of the image field and a second axis corresponding to the second spectral dimension of the image field.
Public/Granted literature
- US20160350952A1 AN IMAGING SPECTROMETER DESIGN TOOL FOR EVALUATING FREEFORM OPTICS Public/Granted day:2016-12-01
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