Invention Grant
- Patent Title: Magnetic field measurement method and magnetic field measurement device for measuring and offsetting original magnetic field
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Application No.: US14928320Application Date: 2015-10-30
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Publication No.: US09964604B2Publication Date: 2018-05-08
- Inventor: Kimio Nagasaka
- Applicant: SEIKO EPSON CORPORATION
- Applicant Address: JP Tokyo
- Assignee: SEIKO EPSON CORPORATION
- Current Assignee: SEIKO EPSON CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Oliff PLC
- Priority: JP2014-229915 20141112; JP2014-229916 20141112; JP2015-107151 20150527; JP2015-107152 20150527
- Main IPC: G01R33/02
- IPC: G01R33/02 ; G01R33/032 ; G01R33/26 ; A61B5/04

Abstract:
A light source unit irradiates a gas cell disposed in a measurement region with linearly polarized light in which the direction of travel is a z-axis direction and the vibration direction of an electric field is a y-axis direction. A polarimeter detects optical characteristics of light passing through the gas cell. A magnetic field generator applies an artificial magnetic field, capable of varying an x-axis component, a y-axis component, and a z-axis component, to the measurement region. A calculation control unit generates a plurality of artificial magnetic fields, calculates a magnetization value or a value corresponding to the magnetization value on the basis of the detection results of the polarimeter, and calculates an original magnetic field present in the measurement region, using an artificial magnetic field when the magnetization value or the value corresponding to the magnetization value satisfies a condition for external value.
Public/Granted literature
- US20160131723A1 MAGNETIC FIELD MEASUREMENT METHOD AND MAGNETIC FIELD MEASUREMENT DEVICE Public/Granted day:2016-05-12
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