Invention Grant
- Patent Title: Hybrid interconnect scheme and methods for forming the same
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Application No.: US15160547Application Date: 2016-05-20
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Publication No.: US09966336B2Publication Date: 2018-05-08
- Inventor: Chen-Hua Yu , Tien-I Bao
- Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Slater Matsil, LLP
- Main IPC: H01L21/4763
- IPC: H01L21/4763 ; H01L23/522 ; H01L23/532 ; H01L21/768

Abstract:
A device includes a first low-k dielectric layer, and a copper-containing via in the first low-k dielectric layer. The device further includes a second low-k dielectric layer over the first low-k dielectric layer, and an aluminum-containing metal line over and electrically coupled to the copper-containing via. The aluminum-containing metal line is in the second low-k dielectric layer.
Public/Granted literature
- US20160268194A1 Hybrid Interconnect Scheme and Methods for Forming the Same Public/Granted day:2016-09-15
Information query
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