- Patent Title: Charge trapping split gate device and method of fabricating same
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Application No.: US13715185Application Date: 2012-12-14
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Publication No.: US09966477B2Publication Date: 2018-05-08
- Inventor: Chun Chen , Shenqing Fang , Unsoon Kim , Mark T. Ramsbey , Kuo Tung Chang , Sameer S. Haddad
- Applicant: Cypress Semiconductor Corporation
- Applicant Address: US CA San Jose
- Assignee: Cypress Semiconductor Corporation
- Current Assignee: Cypress Semiconductor Corporation
- Current Assignee Address: US CA San Jose
- Main IPC: H01L29/792
- IPC: H01L29/792 ; H01L27/11573 ; H01L29/423 ; H01L29/66

Abstract:
Embodiments provide a split gate device, methods for fabricating a split gate device, and integrated methods for fabricating a split gate device and a periphery device. In an embodiment, the split gate device is a charge trapping split gate device, which includes a charge trapping layer. In another embodiment, the split gate device is a non-volatile memory cell, which can be formed according to embodiments as standalone or embedded with a periphery device.
Public/Granted literature
- US20140170843A1 Charge Trapping Split Gate Device and Method of Fabricating Same Public/Granted day:2014-06-19
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