Invention Grant
- Patent Title: Monitoring apparatus for machine tool
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Application No.: US15283562Application Date: 2016-10-03
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Publication No.: US09984452B2Publication Date: 2018-05-29
- Inventor: Tomoharu Ando , Takaaki Tanaka
- Applicant: Okuma Corporation
- Applicant Address: JP Niwa-Gun
- Assignee: Okuma Corporation
- Current Assignee: Okuma Corporation
- Current Assignee Address: JP Niwa-Gun
- Agency: Burr & Brown, PLLC
- Priority: JP2015-214559 20151030
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06T7/00 ; G06K9/62 ; G06T7/60 ; G01L1/00

Abstract:
In an NC device having a function as a monitoring apparatus for a machine tool, a monitoring parameter and a retracting parameter which are set and inputted through an input unit by an operator, can be stored in a storage unit. When, for example, monitoring is performed by using a load on a main spindle as machine information, a machining monitoring unit displays a monitored state on a monitor, and compares a threshold value, of the load on the main spindle, according to which occurrence of abnormality is determined, and which is set in the monitoring parameter, and an instruction load generated by a machine operation instruction unit with each other, to determine whether or not abnormality has occurred. When abnormality is determined as having occurred, a retracting instruction is transmitted to a retracting instruction unit according to the retracting parameter, and display is performed on the monitor.
Public/Granted literature
- US20170124697A1 MONITORING APPARATUS FOR MACHINE TOOL Public/Granted day:2017-05-04
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