Invention Grant
- Patent Title: Method and device for measuring features on or near an object
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Application No.: US15018628Application Date: 2016-02-08
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Publication No.: US09984474B2Publication Date: 2018-05-29
- Inventor: Clark Alexander Bendall
- Applicant: General Electric Company
- Agency: Mintz Levin Cohn Ferris Glovsky and Popeo, P.C.
- Main IPC: G01R33/12
- IPC: G01R33/12 ; G06T7/60 ; G01B11/24 ; G06T19/00 ; G06F3/00 ; G06F3/0484 ; G06T7/00 ; G06T7/62

Abstract:
A method and device for measuring dimensions of a feature on or near an object using a video inspection device. A reference surface is determined based on reference surface points on the surface of the object. One or more measurement cursors are placed on measurement pixels of an image of the object. Projected reference surface points associated with the measurement pixels on the reference surface are determined. The dimensions of the feature can be determined using the three-dimensional coordinates of at least one of the projected reference surface points.
Public/Granted literature
- US20160196643A1 METHOD AND DEVICE FOR MEASURING FEATURES ON OR NEAR AN OBJECT Public/Granted day:2016-07-07
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