Invention Grant
- Patent Title: Measurement probe and optical measurement system
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Application No.: US15266406Application Date: 2016-09-15
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Publication No.: US09986891B2Publication Date: 2018-06-05
- Inventor: Seiki Toriyama
- Applicant: OLYMPUS CORPORATION
- Applicant Address: JP Tokyo
- Assignee: OLYMPUS CORPORATION
- Current Assignee: OLYMPUS CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Oliff PLC
- Main IPC: G01N21/47
- IPC: G01N21/47 ; A61B1/00 ; A61B1/07 ; A61B5/00 ; A61B5/053 ; G01N21/49 ; A61B5/01

Abstract:
A measurement probe includes: a plurality of optical fibers including an illumination fiber configured to propagate light to irradiate a measuring object and including a light receiving fiber configured to receive scattered light retuned from the measuring object; and a detection portion configured to detect contact with the measuring object, the detection portion having a contact part provided on a part of a side portion of the measurement probe, the side portion forming a surface along a longitudinal direction of the measurement probe, the contact part being configured to be in contact with measuring object.
Public/Granted literature
- US20170082534A1 MEASUREMENT PROBE AND OPTICAL MEASUREMENT SYSTEM Public/Granted day:2017-03-23
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