Invention Grant
- Patent Title: Substrate etch
-
Application No.: US14914215Application Date: 2013-08-30
-
Publication No.: US09988263B2Publication Date: 2018-06-05
- Inventor: Patrick Wayne Sadik , Roger A. McKay
- Applicant: HEWLETT-PACKARD DEVELOPMENT COMPANY, L.P.
- Applicant Address: US TX Houston
- Assignee: Hewlett-Packard Development Company, L.P.
- Current Assignee: Hewlett-Packard Development Company, L.P.
- Current Assignee Address: US TX Houston
- Agency: HP Inc. Patent Department
- International Application: PCT/US2013/057610 WO 20130830
- International Announcement: WO2015/030803 WO 20150305
- Main IPC: H01L21/306
- IPC: H01L21/306 ; B81C1/00 ; B41J2/16

Abstract:
An example provides a method including sputtering a metal catalyst onto a substrate, exposing the substrate to a solution that reacts with the metal catalyst to form a plurality of pores in the substrate, and etching the substrate to remove the plurality of pores to form a recess in the substrate.
Public/Granted literature
- US20160200568A1 Substrate Etch Public/Granted day:2016-07-14
Information query
IPC分类: