Invention Grant
- Patent Title: Yield monitoring apparatus, systems, and methods
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Application No.: US15631931Application Date: 2017-06-23
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Publication No.: US09989395B2Publication Date: 2018-06-05
- Inventor: Justin Koch , Michael Strnad
- Applicant: Precision Planting LLC
- Applicant Address: US IL Tremont
- Assignee: Precision Planting LLC
- Current Assignee: Precision Planting LLC
- Current Assignee Address: US IL Tremont
- Agency: Larkin Hoffman Daly & Lindgren, Ltd.
- Agent Thomas J. Oppold
- Main IPC: G01F1/30
- IPC: G01F1/30 ; G01F15/12 ; A01D41/127 ; A01D61/04 ; G01F3/00

Abstract:
Apparatus, systems and methods are provided for monitoring yield while harvesting grain. Grain released from paddles on the clean grain elevator chain of a harvester contacts a flow sensor which reports the rate of grain flow through the clean grain elevator. In some embodiments a brush is mounted to the chain and disposed to clean the flow sensor surface. In other embodiments a bucket mounted to the clean grain elevator chain releases grain against the flow sensor at a rate dependent on a grain property.
Public/Granted literature
- US20170292867A1 YIELD MONITORING APPARATUS, SYSTEMS, AND METHODS Public/Granted day:2017-10-12
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