Invention Grant
- Patent Title: X-ray fluorescence analyzing system
-
Application No.: US15094142Application Date: 2016-04-08
-
Publication No.: US09989484B2Publication Date: 2018-06-05
- Inventor: Motoyuki Yamagami , Hiroyuki Kawakami
- Applicant: RIGAKU CORPORATION
- Applicant Address: JP Tokyo
- Assignee: Rigaku Corporation
- Current Assignee: Rigaku Corporation
- Current Assignee Address: JP Tokyo
- Agency: Sughrue Mion, PLLC
- Priority: JP2015-081884 20150413
- Main IPC: G01N23/223
- IPC: G01N23/223

Abstract:
An X-ray fluorescence analyzing system includes: a cassette (3) in which a substrate (1) is housed; a vapor phase decomposing device (20) for dissolving and then drying a measurement object (2) on a sample substrate surface (11a) to be held thereon; at least one measurement substrate (12); a sample recovering device (30) for dripping and drying a recovery liquid (4), which has recovered the measurement object (2) from the sample substrate (11), onto a predetermined dripping position on a measurement substrate surface (12a) to hold the recovery liquid (4) thereon; an X-ray fluorescence spectrometer (40); a conveying device (50) for conveying the substrate (1); and a control device (60) for controlling the devices (20, 30, 40, 50). The recovery liquids (4) of the measurement objects (2) from a plurality of the sample substrates (11) are dripped and dried on the single measurement substrate surface (12a) to be measured.
Public/Granted literature
- US20160299089A1 X-RAY FLUORESCENCE ANALYZING SYSTEM Public/Granted day:2016-10-13
Information query