Invention Grant
- Patent Title: API-based pattern-controlled test on an ATE
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Application No.: US14687259Application Date: 2015-04-15
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Publication No.: US09989591B2Publication Date: 2018-06-05
- Inventor: Liang Ge , Jia-Min Wang
- Applicant: Advantest Corporation
- Applicant Address: JP Tokyo
- Assignee: ADVANTEST CORPORATION
- Current Assignee: ADVANTEST CORPORATION
- Current Assignee Address: JP Tokyo
- Priority: CN201410152088 20140415
- Main IPC: G06F11/22
- IPC: G06F11/22 ; G06F17/50 ; G01R31/3177 ; G01R31/319 ; G01R31/28 ; G06F11/273

Abstract:
Method and apparatus for performing Pattern-Controlled tests on an automatic test equipment (ATE). The ATE includes a diagnostic instrument and a control device. An application programming interface (API) is installed in the control device and operates to interact with a test program and thereby automatically controls the diagnostic instrument to perform a test. The test program is coded in a high-level programming language and defines a plurality of operation events for the test based on user input. The API identifies the operational events and determines respective operational types associated therewith. Events of an operational type are assigned to a respective pattern label. The pattern labels are then aggregated into a pattern burst which is downloaded to the diagnostic instrument.
Public/Granted literature
- US20150293174A1 API-BASED PATTERN-CONTROLLED TEST ON AN ATE Public/Granted day:2015-10-15
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