Invention Grant
- Patent Title: Inspection system for container
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Application No.: US14576715Application Date: 2014-12-19
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Publication No.: US09989668B2Publication Date: 2018-06-05
- Inventor: Shangmin Sun , Weifeng Yu , Liwei Song
- Applicant: Nuctech Company Limited
- Applicant Address: CN Haidian District, Beijing
- Assignee: Nuctech Company Limited
- Current Assignee: Nuctech Company Limited
- Current Assignee Address: CN Haidian District, Beijing
- Agency: Merchant & Gould P.C.
- Priority: CN201410031016 20140122
- Main IPC: G01N23/04
- IPC: G01N23/04 ; G01V5/00

Abstract:
The present invention provides an inspection system for a container. It comprises: a radiation source, configured to provide X-rays for scanning the container; a detector, configured to receive the X-rays emitted from the radiation source; a body of the inspection system, on which the radiation source and the detector are provided; wherein a size of the body of the inspection system is set to facilitate the inspection of the container. The inspection system of the present invention can inspect in batches the container in the wharf or goods yard.
Public/Granted literature
- US20150204999A1 INSPECTION SYSTEM FOR CONTAINER Public/Granted day:2015-07-23
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