Invention Grant
- Patent Title: Transmitter, integrated circuit, detection section and method for testing integrated circuit
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Application No.: US15453422Application Date: 2017-03-08
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Publication No.: US09991974B2Publication Date: 2018-06-05
- Inventor: Yoshinori Takahashi
- Applicant: Mitsubishi Electric Corporation
- Applicant Address: JP Tokyo
- Assignee: Mitsubishi Electric Corporation
- Current Assignee: Mitsubishi Electric Corporation
- Current Assignee Address: JP Tokyo
- Agency: Studebaker & Brackett PC
- Priority: JP2016-173631 20160906
- Main IPC: G01R31/02
- IPC: G01R31/02 ; H04B17/00 ; H04B17/16 ; G01R31/28 ; G01R31/317

Abstract:
An integrated circuit according to the present invention includes a transmission circuit that transmits a millimeter wave signal, a detection section that detects the millimeter wave signal, an output terminal connected to an output of the transmission circuit via a first wire, a detection terminal provided adjacent to the output terminal and connected to an input of the detection section via a second wire, a first grounding terminal provided adjacent to the output terminal and connected to the transmission circuit via a first grounding wire for grounding the transmission circuit and a second grounding terminal provided adjacent to the detection terminal and connected to the detection section via a second grounding wire for grounding the detection section, wherein the first grounding wire and the second grounding wire are arranged around the first wire and the second wire.
Public/Granted literature
- US20180069641A1 TRANSMITTER, INTEGRATED CIRCUIT, DETECTION SECTION AND METHOD FOR TESTING INTEGRATED CIRCUIT Public/Granted day:2018-03-08
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