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公开(公告)号：JP4883549B2
公开(公告)日：2012-02-22
申请号：JP2004356640
申请日：2004-12-09
Applicant: 分光計器株式会社 , 大学共同利用機関法人自然科学研究機構
CPC classification number: G01J3/02 , G01J3/0208 , G01J3/0218 , G01J3/0221 , G01J3/0291 , G01J3/0294 , G01J3/1804
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公开(公告)号：JP2006135125A
公开(公告)日：2006-05-25
申请号：JP2004323199
申请日：2004-11-08
Applicant: Bunkoh-Keiki Co Ltd , Hokkaido Univ , 分光計器株式会社 , 国立大学法人 北海道大学
Inventor： TAKAHASHI TAMOTSU , KURIHARA KOICHI
Abstract: PROBLEM TO BE SOLVED: To provide a high-mobility measuring device with reduced noise in a portion where the drift time is short in TOF method.
SOLUTION: The high-mobility measuring device 10 comprises a means 12 of arranging an object to be measured which includes a probe which can be brought into contact with an electrode set up on the object to be measured, light irradiation means 14 of irradiating light on the object to be measured, voltage application means 16 for applying a voltage to the electrode via the probe, signal detection means 18 of detecting a current signal flowing in the object to be measured, and signal processing means 20 of processing a detection signal. The high mobility measuring device 10 performs measurement by the TOF method. This device 10 also includes a noise-reducing means which makes the light irradiation means 14 and other means (16 and 18) connected optically, and reduces the noise generated by the light irradiation means 14, by electrically separating and insulating the light irradiation means 14 from the other means; and a noise elimination means (20) for eliminating the noise from the light irradiation means which is mixed into the detection signal for the measurement by the TOF method.
COPYRIGHT: (C)2006,JPO&NCIPIAbstract translation: 要解决的问题：为了在TOF方法中提供漂移时间短的部分中具有降低的噪声的高迁移率测量装置。 解决方案：高迁移率测量装置10包括：设置待测物体的装置12，其包括可与设在待测物体上的电极接触的探针;光照射装置14， 将被测定物体照射光，经由探针向电极施加电压的电压施加装置16，检测被测定物体中流动的电流信号的信号检测装置18以及处理检测对象物的信号处理装置20 信号。 高移动性测定装置10通过TOF法进行测定。 该装置10还包括噪声降低装置，其使光照射装置14和其他装置（16和18）光学连接，并且通过将光照射装置14电隔离和绝缘来降低由光照射装置14产生的噪声 从其他方式; 以及用于消除来自光照射装置的噪声的噪声消除装置（20），其通过TOF方法混合到用于测量的检测信号中。 版权所有（C）2006，JPO＆NCIPI
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Patent Agency Ranking
公开(公告)号：JP2015162961A
公开(公告)日：2015-09-07
申请号：JP2014036646
申请日：2014-02-27
Applicant: 国立大学法人金沢大学 , 分光計器株式会社
CPC classification number: Y02E10/549 , Y02P70/521
Abstract: 【課題】電子ドナー及び電子アクセプターの領域毎に、励起子の生成・拡散の効率を評価できる有機薄膜太陽電池の評価方法を提供すること。 【解決手段】評価方法は、順バイアス印加工程、分光感度測定工程、解析工程を含む。順バイアス印加工程では、薄膜素子の電極間に順バイアス電圧を印加する。分光感度測定工程では、薄膜素子に単色光を照射し、その波長を変化させつつ電極間電流を検出し、これをスペクトル特性とする。解析工程では、スペクトル特性から薄膜素子の各領域の効率を評価する。分光感度測定工程では、順バイアス電圧を零から正の電圧値まで変化させて、バイアス電圧ごとにスペクトル特性を取得する。解析工程では、電子ドナー領域の吸収波長域におけるスペクトル特性の変化に基づいて該領域の効率を評価し、電子アクセプター領域についても同様にその吸収波長域のスペクトル特性の変化に基づいて評価する。 【選択図】 図5
Abstract translation: 要解决的问题：提供一种能够有效评估激子在电子给体和电子受体的每个区域的产生和扩散的有机薄膜太阳能电池的评估方法。解决方案：评估方法包括正向偏压施加步骤，光谱灵敏度 测量步骤和分析步骤。 在正向偏压施加步骤中，在薄膜元件的电极之间施加正向偏置电压。 在光谱灵敏度测量步骤中，用单色信号照射薄膜元件，并且在单色光的波长变化的同时检测电极间电流，从而获得光谱特性。 在分析步骤中，从光谱特性来评价薄膜元件的每个区域的效率。 在光谱灵敏度测量步骤中，每个偏置电压获得光谱特性，而正向偏置电压从零变为正电压值。 在分析步骤中，基于电子给体区域的吸收波长区域中的光谱特性的变化来评价电子供体区域的效率，同时基于电子受体区域的效率来评价电子受体区域的效率 吸收波长区域的光谱特性的变化。
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公开(公告)号：JP2006133100A
公开(公告)日：2006-05-25
申请号：JP2004323200
申请日：2004-11-08
Applicant: Bunkoh-Keiki Co Ltd , Hokkaido Univ , 分光計器株式会社 , 国立大学法人 北海道大学
Inventor： TAKAHASHI TAMOTSU , KURIHARA KOICHI
Abstract: PROBLEM TO BE SOLVED: To provide an apparatus for measuring anisotropy of a semiconductor film, which can measure carrier mobility values in two directions, i.e., vertical and horizontal directions of an organic thin film.
SOLUTION: The apparatus 10 for measuring the anisotropy of the semiconductor film is equipped with a measurement object setting means 12 which has a probe contactable with an electrode disposed at an object to be measured; a light irradiation means 14 which irradiates the object to be measured with light; a voltage applying means 16 which applies a voltage to the electrode through the probe; a signal detecting means 18 which detects a current signal flowing in the object to be measured; and a signal processing means 20 for processing a detected signal. The measurement object setting means 12 includes three probes which can be positioned independently, and the voltage applying means 16 is made up such that the class of the voltage applied to each probe can be varied, and the measurement can be carried out in two kinds of measurement modes, i.e., a TOF method measurement mode and an FET method measurement mode.
COPYRIGHT: (C)2006,JPO&NCIPIAbstract translation: 要解决的问题：提供一种用于测量半导体膜的各向异性的装置，其可以测量有机薄膜的两个方向即垂直和水平方向上的载流子迁移率值。 ＆lt; P＆gt;解决方案：用于测量半导体膜的各向异性的装置10配备有测量对象设定装置12，该测量对象设定装置12具有可与设置在被测量对象上的电极接触的探针; 用光照射待测物体的光照射装置14; 电压施加装置16，其通过探针向电极施加电压; 信号检测装置18，其检测在被测量物体中流动的电流信号; 以及用于处理检测信号的信号处理装置20。 测量对象设置装置12包括可以独立定位的三个探针，并且施加电压施加装置16使得可以改变施加到每个探针的电压的类别，并且可以以两种 测量模式，即TOF方法测量模式和FET方法测量模式。 版权所有（C）2006，JPO＆NCIPI
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8.发明专利Optically measuring method, and method and device for measuring light emitting element 有权光学测量方法，以及用于测量发光元件的方法和装置
公开(公告)号：JP2005172731A
公开(公告)日：2005-06-30
申请号：JP2003416122
申请日：2003-12-15
Applicant: Bunkoh-Keiki Co Ltd , National Institute Of Advanced Industrial & Technology , 分光計器株式会社 , 独立行政法人産業技術総合研究所
Inventor： KOBAYASHI SHUNSUKE , SASAKI FUMIO , HARAICHI SATOSHI , ASANO TSUNEO , IKEDA TAKESHI , MATSUDA TSUTOMU
Abstract: PROBLEM TO BE SOLVED: To obtain a light source with known spectral absolute photon flux with a simple method.
SOLUTION: Outgoing light of a spectral light source 100 having a lamp 1, converging optical systems (lenses) 2 and 4 and a spectroscope 3 is measured by a light detector 5 with a known quantum efficiency, and the spectral absolute photon flux of the spectral light source 100 is determined based on the measurement results. This light source is used as a light source with known spectral absolute photon flux. Calibration of a spectrometric device is performed by use of this light source with known spectral absolute photon flux to measure spectral characteristics of a light emitting element such as an OLED.
COPYRIGHT: (C)2005,JPO&NCIPIAbstract translation: 要解决的问题：以简单的方法获得具有已知光谱绝对光子通量的光源。 解决方案：具有灯1的聚光光学系统（透镜）2和4以及分光镜3的分光光源100的出射光通过具有已知量子效率的光检测器5测量，光谱绝对光子通量 基于测量结果来确定光谱光源100。 该光源被用作具有已知光谱绝对光子通量的光源。 通过使用具有已知光谱绝对光子通量的该光源来测量光谱测量装置的校准来测量诸如OLED的发光元件的光谱特性。 版权所有（C）2005，JPO＆NCIPI
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公开(公告)号：JP2007121087A
公开(公告)日：2007-05-17
申请号：JP2005313004
申请日：2005-10-27
Applicant: Bunkoh-Keiki Co Ltd , 分光計器株式会社
Inventor： KAMIYAMA KEITA , MATSUDA TSUTOMU
Abstract: PROBLEM TO BE SOLVED: To provide a spectroscope with high wavelength resolution and high space resolution.
SOLUTION: This spectroscope 110 is equipped with an incidence slit 112, a collimator mirror 114 for turning light passing through the incidence slit 112 into parallel light, a diffraction grating 118 for receiving the parallel light from the collimator mirror 114 to output light at a different angle according to its wavelength, a first concave mirror 120 for turning output light from the diffraction grating 118 into parallel light, a second concave mirror 122 for condensing the parallel light from the concave mirror 120, and a light reception means 124 comprising a light reception surface 124a with the light condensed by the concave mirror 122 focused thereon. This spectroscope 110 is characterized in that spectrum measurement is performed by causing a dispersed light image of the incidence slit 112 to be focused on the reception surface 124a of the reception means 124.
COPYRIGHT: (C)2007,JPO&INPITAbstract translation: 要解决的问题：提供具有高波长分辨率和高空间分辨率的分光镜。 解决方案：该分光镜110配备有入射狭缝112，用于将穿过入射狭缝112的光转动成平行光的准直镜114，用于接收来自准直镜114的平行光以输出光的衍射光栅118 根据其波长以不同的角度，将用于将来自衍射光栅118的光转换成平行光的第一凹面镜120，用于会聚来自凹面镜120的平行光的第二凹面镜122和包括 由凹面镜122聚光的光聚焦在其上的光接收表面124a。 该分光镜110的特征在于，通过使入射狭缝112的分散的光图像聚焦在接收装置124的接收表面124a上来进行光谱测量。版权所有（C）2007，JPO＆INPIT
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公开(公告)号：JP2006162509A
公开(公告)日：2006-06-22
申请号：JP2004356640
申请日：2004-12-09
Applicant: Bunkoh-Keiki Co Ltd , National Institutes Of Natural Sciences , 分光計器株式会社 , 大学共同利用機関法人自然科学研究機構
Inventor： IDA KATSUMI , IKEDA TAKESHI
CPC classification number: G01J3/02 , G01J3/0208 , G01J3/0218 , G01J3/0221 , G01J3/0291 , G01J3/0294 , G01J3/1804
Abstract: PROBLEM TO BE SOLVED: To provide a spectroscope of high wavelength resolution and high space resolution.
SOLUTION: This spectroscope is provided with an incident slit 12, a collimator lens optical system 14 for bringing light transmitted through the incident slit into parallel light, a reflection type diffraction grating 16 for receiving the parallel light to output the light to a different angle in response to a wavelength, a convergence lens optical system 18 for converging output light from the diffraction grating, and a two-dimensional photoreception means 20 having a two-dimensional photoreception face for detecting converged light by the convergence lens optical system. An optical axis of the collimator lens optical system is arranged to bring an angle 2γ formed with respect to an optical axis of the convergence lens optical system into an acute angle, the convergence lens optical system and the diffraction grating is arranged to make a distance therebetween nearer than a distance between the collimator lens optical system and the diffraction grating, and a normal vector in the central part of a reflection face of the diffraction grating is set to be directed to an arrangement side of the collimator lens optical system, with respect to a bisector of the angle formed by the collimator lens optical system and the convergence lens optical system.
COPYRIGHT: (C)2006,JPO&NCIPIAbstract translation: 要解决的问题：提供高分辨率和高空间分辨率的分光镜。 解决方案：该分光镜设置有入射狭缝12，用于将透过入射狭缝的光带入平行光的准直透镜光学系统14，用于接收平行光以将光输出到一个的反射型衍射光栅16 响应于波长的不同角度，用于会聚来自衍射光栅的输出光的会聚透镜光学系统18和具有二维光接收面的二维光接收装置20，用于通过会聚透镜光学系统检测会聚光。 准直透镜光学系统的光轴被配置为使得相对于会聚透镜光学系统的光轴形成的角度2γ成锐角，会聚透镜光学系统和衍射光栅被布置成使它们之间的距离 比准直透镜光学系统和衍射光栅之间的距离更靠近衍射光栅的反射面的中心部分的法线向量相对于准直透镜光学系统的配置侧被设定为相对于 由准直透镜光学系统和会聚透镜光学系统形成的角度的平分线。 版权所有（C）2006，JPO＆NCIPI
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