2단계 양극반응을 이용한 SOI(Silicon-On-insulation)구조의 형성방법
    2.
    发明授权

    公开(公告)号:KR1019950009616B1

    公开(公告)日:1995-08-25

    申请号:KR1019920011004

    申请日:1992-06-24

    Abstract: forming a silicon oxide film(2,2') on a silicon substrate; forming a photoresist on the defined portion of the silicon oxide film(2); etching the silicon oxide film(2) using the photoresist as a mask; forming an n type silicon layer(4) in the sustrate(1); forming a porous silicon layer(5) of 1-6 micro meter depth in the substrate(1) by first step anodic reaction; and oxidizing the porous silicon layer(5) by putting the substrate(1) in boiling water and etching it; forming a porous silicon layer(5) in the substrate(1) by second step anodic reaction; oxidizing the porous silicon layer(5) by conventional oxidation process. The two step anodic reacton raises the porosity of the porous silicon layer, removes a cups, and reduce a stress of side direction.

    Abstract translation: 在硅衬底上形成氧化硅膜(2,2'); 在氧化硅膜(2)的限定部分上形成光致抗蚀剂; 使用光致抗蚀剂作为掩模蚀刻氧化硅膜(2); 在所述胎面(1)中形成n型硅层(4); 通过第一步阳极反应在衬底(1)中形成1-6微米深度的多孔硅层(5); 以及通过将基板(1)放入沸水中并对其进行蚀刻来氧化多孔硅层(5); 通过第二步阳极反应在衬底(1)中形成多孔硅层(5); 通过常规氧化工艺氧化多孔硅层(5)。 两步阳极反应物提高多孔硅层的孔隙率,去除杯子,并减少侧面方向的应力。

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