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1.发明专利
公开(公告)号：CA2499396C
公开(公告)日：2012-09-18
申请号：CA2499396
申请日：2003-10-02
Applicant: ABB INC
Inventor： BURK GARY NEIL , DOMIN THOMAS MICHAEL , MAXSON RODNEY DALE , DAUGHERTY DENNIS CHARLES , STURM STEVEN PERRY
Abstract: A single vane (46, 48) shutter flag (38) is asynchronously controlled (82) so that a measuring system light source (22) is interrupted for a minimum necessary amount of time for standardization/calibration and normalization of InGaAs system detectors (68a - 68d). Source/detector hemispheres (50, 62) or serially connected randomly oriented fiber bundles (132) homogenize light passing to the detectors. Light source testing is performed by measuring spectral power distributions at a plurality of light source power levels and comparing the measurements to baseline characteristics established for the light source. Calibration sample life is extended indefinitely by controlling the shutter flag to block source light except for short calibration time periods during which standard light levels are provided.
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Patent Agency Ranking2.发明专利
公开(公告)号：CA2499396A1
公开(公告)日：2004-04-15
申请号：CA2499396
申请日：2003-10-02
Applicant: ABB INC
Inventor： DAUGHERTY DENNIS CHARLES , STURM STEVEN PERRY , MAXSON RODNEY DALE , DOMIN THOMAS MICHAEL , BURK GARY NEIL
Abstract: A single vane (46, 48) shutter flag (38) is asynchronously controlled (82) s o that a measuring system light source (22) is interrupted for a minimum necessary amount of time for standardization/calibration and normalization o f InGaAs system detectors (68a - 68d). Source/detector hemispheres (50, 62) or serially connected randomly oriented fiber bundles (132) homogenize light passing to the detectors. Light source testing is performed by measuring spectral power distributions at a plurality of light source power levels and comparing the measurements to baseline characteristics established for the light source. Calibration sample life is extended indefinitely by controllin g the shutter flag to block source light except for short calibration time periods during which standard light levels are provided.
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3.发明申请AN INFRARED MEASURING APPARATUS AND METHOD FOR ON-LINE APPLICATION IN MANUFACTURING PROCESSES 审中-公开一种用于在制造过程中在线应用的红外测量装置和方法
公开(公告)号：WO2004031752A3
公开(公告)日：2004-07-15
申请号：PCT/US0331142
申请日：2003-10-02
Applicant: ABB INC
Inventor： BURK GARY NEIL , DOMIN THOMAS MICHAEL , MAXSON RODNEY DALE , DAUGHERTY DENNIS CHARLES , STURM STEVEN PERRY
CPC classification number: G01N21/86 , G01N21/3563 , G01N33/346 , G01N2021/8917 , G02B26/04
Abstract: A single vane (46, 48) shutter flag (38) is asynchronously controlled (82) so that a measuring system light source (22) is interrupted for a minimum necessary amount of time for standardization/calibration and normalization of InGaAs system detectors (68a - 68d). Source/detector hemispheres (50, 62) or serially connected randomly oriented fiber bundles (132) homogenize light passing to the detectors. Light source testing is performed by measuring spectral power distributions at a plurality of light source power levels and comparing the measurements to baseline characteristics established for the light source. Calibration sample life is extended indefinitely by controlling the shutter flag to block source light except for short calibration time periods during which standard light levels are provided.
Abstract translation: 对一个单叶片（46,48）快门标志（38）进行异步控制（82），从而使测量系统光源（22）中断所需的最小时间量，用于InGaAs系统检测器（68a）的标准化/校准和归一化 - 68d）。 源/检测器半球（50,62）或串联连接的随机取向的纤维束（132）使通过检测器的光均匀化。 光源测试是通过测量多个光源功率水平下的光谱功率分布并将测量结果与为光源建立的基线特性进行比较来执行的。 校准样本寿命通过控制快门标志来阻止源光而无限延长，除了提供标准光照水平的短校准时间段外。
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