SAMPLE COLLECTION DEVICE AND SAMPLE COLLECTION DEVICE ARRAY
    2.
    发明申请
    SAMPLE COLLECTION DEVICE AND SAMPLE COLLECTION DEVICE ARRAY 有权
    样品收集装置和样品收集装置阵列

    公开(公告)号:US20160377513A1

    公开(公告)日:2016-12-29

    申请号:US15073667

    申请日:2016-03-18

    CPC classification number: G01N1/2813 H01J37/20 H01J37/26 H01J37/32009

    Abstract: A sample collective device includes two substrates and a spacer. Each substrate has a first surface and a second surface, and the two substrates are arranged with the first surfaces facing each other. The spacer is disposed between the two first surfaces for bonding and fixing the two substrates and forming a sample containing space. In addition, each of the substrates includes a first weakening structure located in the periphery of the sample containing space and exposed on the first surface. A sample collective device array including a plurality of the aforementioned sample collective devices is also provided.

    Abstract translation: 样本集体装置包括两个基板和间隔件。 每个基板具有第一表面和第二表面,并且两个基板被布置成使得第一表面彼此面对。 间隔件设置在两个第一表面之间,用于粘合和固定两个基底并形成样品容纳空间。 此外,每个基板包括位于样品容纳空间的周边并暴露在第一表面上的第一弱化结构。 还提供了包括多个上述样本集合装置的样本集合装置阵列。

Patent Agency Ranking