SPECTROSCOPIC FLUORESCENT COLOR METER

    公开(公告)号:JPS5470879A

    公开(公告)日:1979-06-07

    申请号:JP13670977

    申请日:1977-11-16

    Applicant: HITACHI LTD

    Inventor: BABA GOROU

    Abstract: PURPOSE:To separately meter the reflected or transmitted component and the fluorescent component at a point of a sample by separating the light, which is relflected or transmitted at the sample, into that having the same or different wavelength as or from the incident light to separately store the received output when the incident wavelength from a light source is changed. CONSTITUTION:The light from a white light source 1 is converted through spectroscopic means 2 into a monochromatic light, and a reference white plate 3 having its absolute spectroscopic reflectivity known is diffused and illuminated by a integrating bulb 5. The reflected light is guided by a lens 6 into a spectrometer incident slit 7 so that it may be emanated by a diffractive grating 8 having a concave side to the position of an image sensor 9 corresponding to the incident wavelength. Then, the reference white plate 3 is replaced by a sample 4 containing a fluorescent light, and similar measurements are accomplished so that the signals from the sensor 9 in the same wavelength as the incident light are stored in the first memory 11, whereas the incident light are stored in the first memory 11, whereas the signals from the sensor having different wavelength are stored in the memory 12. The illuminating light is scanned with the spectroscopic means so that the signals at respective wavelengthes are summed at the memories 11 and 12. Then, it is possible to separately display the spectroscopic reflection and fluorescent lights in first and second display units 13 and 14.

    COLOR MEASURING DEVICE
    2.
    发明专利

    公开(公告)号:JPS5716324A

    公开(公告)日:1982-01-27

    申请号:JP9063680

    申请日:1980-07-04

    Applicant: HITACHI LTD

    Inventor: BABA GOROU

    Abstract: PURPOSE:To perform a simple and high-precise evaluation of a color of an object which varies in an observation direction, by a method wherein a reflecting or transmitting light, which is generated in case a sample is illuminated from one-way direction, is received in a plural number of directions, and spectroreflection coefficient and the like is compared and measured. CONSTITUTION:A reflecting light or a transmitting light, which is generated in case a sample is illuminated from one-way direction, is received in a plural number of direction, and a spectroreflection coefficient or a difference in or a ration of a three- excitation value in their respective directions is operated and indicated. For example, a white light, radiated from a light source 1, is focused through a lens 2, and a sample 3 is irradiated with the white color. Two-way light, which the sample surface reflects, is fed directly to a slit 11 in a spectrophotometer through light guides 10a and 10b, and is separately image-formed on photo detector arrays 13a and 13b by means of a concave diffraction lattice 12. The outputs are compared at every wavelength by means of an operational amplifier 14, and the compared results are indicated in an indicator 15. This method permits the high-precise measurement of a color of an object, which varies in the direction, by means of a simple device.

    Spectrophotometer
    3.
    发明专利
    Spectrophotometer 失效
    分光光度计

    公开(公告)号:JPS5763426A

    公开(公告)日:1982-04-16

    申请号:JP13763680

    申请日:1980-10-03

    Applicant: Hitachi Ltd

    Inventor: BABA GOROU

    CPC classification number: G01J3/28 G01J3/0251 G01J3/502 G01J3/524

    Abstract: PURPOSE:To enable to appropriately obtain a total spectro RF even if a fluorescent color is contained, by a method wherein a spectro reflection refelectance factor (RF) of a sample is measured in a reflection measuring manner, and a spectro fluorescence RF is measured in an radiation measuring manner. CONSTITUTION:A mirror 6 reflects a light from a light source 1 through a lens 2, a slit 4, and a concave diffraction grating 5, and the light enters into an integrating sphere 8 through the diffraction trating 5, the slit 4, and a half mirror 3 again. The light, which disperses in the integrating sphere 8 and is reflected in a stream line direction of a sample 9, disperses at a concave diffraction grating 12 through a half mirror 10 and a slit 11, and is inputted to a light-receiving element group 13. After the relative spectro sensitivity of the light-receiving element group 13 is found, a standard white plate, containing no fluorescent color, is placed at a sample surface 9 of the integrating sphere 8 to find a spectro distribution. Then, after the spectro distribution is measured on the sample surface 9, a light-shielding plate 7 is placed in front of the mirror 6, and a measurement takes place as the light is shielded in order from a short wavelength side of a spectrum. Processing of the data by means of a signal processing part 35 permits obtaining of a total spectro RF of the sample.

    Abstract translation: 目的:即使在含有荧光色的情况下,也可以通过以反射测定方式测定样品的分光反射重复系数(RF)的方法,能够适当地获得全光谱RF,并且测定分光荧光RF 辐射测量方式。 构成:反射镜6通过透镜2,狭缝4和凹面衍射光栅5反射来自光源1的光,并且光通过衍射台5,狭缝4和光源4进入积分球8。 半反射镜3再次。 分散在积分球8中并在样品9的流线方向上反射的光在凹面衍射光栅12上通过半透半反镜10和狭缝11分散,并被输入到光接收元件组 在发现光接收元件组13的相对光谱灵敏度之后,将不含荧光色的标准白板放置在积分球8的样品表面9上,以找到光谱分布。 然后,在样品表面9上测量光谱分布后,将光屏蔽板7放置在反射镜6的前面,并且当光从光谱的短波长侧依次屏蔽时,进行测量。 通过信号处理部分35对数据的处理允许获得样品的总分光RF。

    MEASURING APPARATUS FOR SURFACE FLUORESCENCE

    公开(公告)号:JPS5599047A

    公开(公告)日:1980-07-28

    申请号:JP608179

    申请日:1979-01-24

    Applicant: HITACHI LTD

    Abstract: PURPOSE:To accomplish a surface fluorescence measurement with limited loss of the quantity of light while effectively removing effect of scattered light on the surface of the test piece by holding it in such a manner that the surface of the test piece is inclined by a fixed angle against the vertical line. CONSTITUTION:An excitation side diffraction grid 14 is so set as to be vertical in the scattering while the entrance slit 15 and the discharge slit 16 are set horizontally. The fluorescence side spectroscope 22 is arranged likewise vertical in the scattering with the slits horizontal. Therefore, the image of the slit 16 with the lens 18 and the image of the entrance slit 20 on the fluorescence side with the lens 19 are horizontal between each other. If the test piece 3 is tilted with the respect to the vertical way, effect of scattered light on the surface of the test piece can be removed effectively.

    MEASURING METHOD OF REFLECTANCE RADIANCE FACTORS OF FLUORESCENT COLOR

    公开(公告)号:JPS53147591A

    公开(公告)日:1978-12-22

    申请号:JP6112377

    申请日:1977-05-27

    Applicant: HITACHI LTD

    Inventor: BABA GOROU

    Abstract: PURPOSE:To let the energies of illuminating light having continuous spectra drop out gradually from the short wavelength side an accurately masure apectral reflectance radiance factors from the tendency of the change in the spectral total radiance factors accompanied with this.

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