公开(公告)号：GB2514402A

公开(公告)日：2014-11-26

申请号：GB201309302

申请日：2013-05-23

Applicant: IBM

Inventor： AKDEMIR BIROL ,  MARQUARDT OLIVER ,  GENTNER THOMAS

IPC: G01R31/3181 ,  G01R31/317

Abstract: An integrated circuit (IC) 5 is tested in a test environment 1 using a virtual test engine 70 and an integrated circuit tester 20 to perform functional and non-functional tests. In a functional test mode, test commands are sent to the integrated circuit tester 20 which creates and applies test patterns as stimulus data to the IC, receives and analyzes response data from the IC, and transmits test results including the response data to the virtual test engine 70 for further analyzing. If failure is detected during the functional test, a non-functional test mode is entered and a serial bit stream is shifted out of the IC. The integrated circuit tester 20 transmits the serial bit stream as an error bit stream to the virtual test engine 70 for further analyzing. The virtual test engine creates and transmits further functional and/or non-functional test commands to the integrated circuit tester based on the test results and/or the error bit stream.