公开(公告)号：EP2128768A4

公开(公告)日：2010-09-15

申请号：EP07850514

申请日：2007-12-12

Applicant: IBM

Inventor： OHBA NOBUYUKI ,  SAKAGUCHI YOSHITAMI ,  TAKANO KOHJI

IPC: G06F11/34

CPC classification number: G06F11/3466 ,  G06F11/3452 ,  G06F2201/86 ,  G06F2201/88

公开(公告)号：EP2124148A4

公开(公告)日：2010-09-08

申请号：EP07859792

申请日：2007-12-12

Applicant: IBM

Inventor： OHBA NOBUYUKI ,  TAKANO KOHJI ,  SAKAGUCHI YOSHITAMI

IPC: G06F11/34 ,  G06F11/30

CPC classification number: G06F11/3452 ,  G06F11/3419 ,  G06F11/3466

公开(公告)号：JPH11337904A

公开(公告)日：1999-12-10

申请号：JP12758398

申请日：1998-05-11

Applicant: IBM

Inventor： SAKAGUCHI YOSHITAMI ,  YAMADA FUMIAKI ,  TAIRA YOICHI

IPC: G02F1/1335 ,  G02F1/133 ,  G02F1/13357 ,  G09G3/34 ,  G09G3/36

Abstract: PROBLEM TO BE SOLVED: To provide a low-cost LCD device capable of realizing a high speed field sequential driving system by writing a 1st color data, a 2nd color data and a 3rd color data simultaneously. SOLUTION: A video control device 12 and a LCD control device 7 write a 1st color data selected from R, G, B data in Y-pieces of pixel lines sequentially starting with a 1st pixel line of a 1st region 3A up to the last pixel line of a 3rd region 3C via a 2nd region 3B. Also, the video control device 12 and the LCD control device write a 2nd color data in Y-pieces of pixel lines sequentially starting with the 1st pixel line of the 2nd region 3B up to the last pixel line of the 1st region 3A via the 3rd region 3C. These, the 3rd color data is written in Y-pieces of Y-pieces of pixel lines sequentially starting with the 1st pixel line of the 3rd region 3C up to the last pixel line of the 2nd region 3B via the 1st region 3A.

公开(公告)号：JPH08185140A

公开(公告)日：1996-07-16

申请号：JP32295794

申请日：1994-12-26

Applicant: IBM

Inventor： KOBAYASHI YOSHINAO ,  SAKAGUCHI YOSHITAMI

IPC: G02F1/133 ,  G09G3/36 ,  G09G5/20 ,  H03K17/687

Abstract: PURPOSE: To increase S/N so as to be suitable for analog ASIC, and increase the operating speed. CONSTITUTION: One end of an analog switch 12 is connected to an input terminal VIN, and the other end is connected to one end of an analog switch 14. It is further connected to one end of an analog switch 16, and the other end of the analog switch 16 is extended to the output side of a buffer amplifier 30. The other end of the analog switch 14 is connected to one end of a hold capacitor 22 the other end of which is grounded, and also connected to the input side of the buffer amplifier 30. When the analog switches 12, 14 are ON and the analog switch 16 is OFF, the hold capacitor 22 charges the signal voltage added to the input terminal VIN. When the analog switches 12, 14 are OFF and the analog switch 16 is ON, the hold capacitor 22 holds the charged voltage. At this time, noise is released to the output side through the analog switch 16.

公开(公告)号：JP2008225759A

公开(公告)日：2008-09-25

申请号：JP2007061959

申请日：2007-03-12

Applicant: Internatl Business Mach Corp ,  インターナショナル・ビジネス・マシーンズ・コーポレーションInternational Business Maschines Corporation

Inventor： TAKANO KOJI ,  OBA NOBUYUKI ,  SAKAGUCHI YOSHITAMI

IPC: G06F9/48 ,  G06F11/34

CPC classification number: G06F11/3419

Abstract: PROBLEM TO BE SOLVED: To detect whether or not specific operation is performed in executing a monitored task on an information processor with a simple configuration.
SOLUTION: This detection device has: a cluster storage part storing a range of an execution time belonging to a cluster in association with each the cluster wherein the execution time of the already executed monitored task is classified; an acquisition part acquiring the execution time of the monitored task according to new execution of the monitored task on the information processor; and a decision part deciding that the specific operation is performed in executing the monitored task on condition that the execution time of the newly executed monitored task is not included in the range corresponding to any cluster.
COPYRIGHT: (C)2008,JPO&INPIT

Abstract translation: 要解决的问题：检测在以简单配置在信息处理器上执行被监视任务是否执行特定操作。 解决方案：该检测装置具有：集群存储部，其存储与已经执行的被监视任务的执行时间分类的每个集群相关联的属于集群的执行时间的范围; 所述获取部根据所述信息处理器的被监视任务的新的执行取得被监视任务的执行时间; 并且判定在执行被监视任务的执行时间不包括在与任何集群对应的范围内的情况下，执行所监视的任务，执行特定操作。 版权所有（C）2008，JPO＆INPIT

公开(公告)号：JP2005107129A

公开(公告)日：2005-04-21

申请号：JP2003340018

申请日：2003-09-30

Applicant: Internatl Business Mach Corp ,  インターナショナル・ビジネス・マシーンズ・コーポレーションInternational Business Maschines Corporation

Inventor： SAKAGUCHI YOSHITAMI ,  NAKANO DAIKI

IPC: H05B33/10 ,  G09F9/00 ,  G09F9/30 ,  G09G3/00 ,  G09G3/20 ,  G09G3/30 ,  G09G3/32 ,  H01L27/12 ,  H01L27/32 ,  H01L51/50 ,  H05B33/14

CPC classification number: G09G3/006 ,  G09G3/3208 ,  H01L27/12

Abstract: PROBLEM TO BE SOLVED: To enable the characteristic inspection of a driving TFT without introducing new wiring for inspection. SOLUTION: The TFT array is equipped with the driving TFT 22 for driving an OLED 21 which is an EL element, first common wiring 11 disposed to perform current supply to the OLED 21 or current discharge therefrom, second common wiring 12 connected alternately to the first common wiring 11 by every horizontal line or every vertical column of pixels and disposed to perform the current supply to the OLED 21 or the current discharge therefrom, and a switching TFT 23 which is a connecting switch for connecting either of the first common wiring 11 and the second common wiring 12 to a pixel electrode 26. COPYRIGHT: (C)2005,JPO&NCIPI

Abstract translation: 要解决的问题：为了实现驱动TFT的特性检查而不引入新的检查接线。 解决方案：TFT阵列配备有用于驱动作为EL元件的OLED 21的驱动TFT22，被布置为对OLED 21进行电流供给的第一公共布线11或其中的电流放电，第二公共布线12交替连接 通过每个水平线或每个垂直列的像素连接到第一公共布线11，并且被布置成执行到OLED 21的电流供应或其中的电流放电;以及开关TFT 23，其是用于连接第一公共 布线11和第二公共布线12连接到像素电极26.版权所有（C）2005，JPO＆NCIPI

公开(公告)号：JPH08166773A

公开(公告)日：1996-06-25

申请号：JP30852694

申请日：1994-12-13

Applicant: IBM

Inventor： KOBAYASHI YOSHINAO ,  SAKAGUCHI YOSHITAMI

IPC: G02F1/133 ,  G09G3/20 ,  G09G3/36

Abstract: PURPOSE: To provide a TFT liquid crystal display panel driver having the capability of coping with the dispersion of devices as well as the fluctuation of temperature and power voltage. (differential amplifier, analog driver). CONSTITUTION: Reference voltage generated with a reference voltage generator 7 is supplied to a buffer amplifier equivalent circuit via a control circuit and to a display cell equivalent circuit actuated with the control circuit, and a response signal to the inputted voltage is sent out from a TFT emulator circuit 11. In addition, the output signal and the reference voltage generated with the reference voltage generator 7 are compared with each other in a difference detection circuit, and an output signal corresponding to the difference is sent to a correction circuit 5. Then, the correction circuit 5 corrects an analog video signal generated at a prestage by use of the output. The corrected analog video signal is outputted to a TFT liquid crystal display panel 23 via a sample hold circuit and a buffer amplifier 21.

公开(公告)号：JP2006133119A

公开(公告)日：2006-05-25

申请号：JP2004323556

申请日：2004-11-08

Applicant: Internatl Business Mach Corp ,  インターナショナル・ビジネス・マシーンズ・コーポレーションInternational Business Maschines Corporation

Inventor： IMURA KENICHI ,  NAKANO DAIKI ,  SAKAGUCHI YOSHITAMI

IPC: G01R31/302 ,  G01R31/00 ,  H01L29/786 ,  H01L51/50 ,  H05B33/12

CPC classification number: G09G3/006

Abstract: PROBLEM TO BE SOLVED: To inspect electric characteristics of a TFT having an open and exposed source electrode or drain electrode by use of a noncontact current source without bad influence (contamination, breakage, etc.) on the TFT.
SOLUTION: The inspection device 100 of a TFT array substrate 14 comprises ion flow feeders 16 and 18 for supplying an ion flow to the surface of the substrate 14 having an array 12 of TFT to be connected to an electrode either whose source or drain is open and exposed, a control circuit 24 for supplying an operating voltage to a gate electrode of a TFT to be inspected in the array, and a measuring circuit 24 measuring an operating current through the source or drain which is not open of the TFT to be inspected.
COPYRIGHT: (C)2006,JPO&NCIPI

Abstract translation: 要解决的问题：通过使用非接触电流源来检查具有开放和暴露的源极电极或漏电极的TFT的电特性，而不会对TFT造成不良影响（污染，破损等）。 解决方案：TFT阵列基板14的检查装置100包括用于向具有TFT阵列12的基板14的表面提供离子流的离子流进料器16和18，其连接到电极的源或源 漏极被打开并暴露，用于向阵列中要检查的TFT的栅电极提供工作电压的控制电路24以及测量电路24，测量不通过TFT的源极或漏极的工作电流 被检查。 版权所有（C）2006，JPO＆NCIPI

公开(公告)号：JP2004347749A

公开(公告)日：2004-12-09

申请号：JP2003142972

申请日：2003-05-21

Applicant: Internatl Business Mach Corp ,  インターナショナル・ビジネス・マシーンズ・コーポレーションInternational Business Maschines Corporation

Inventor： NAKANO DAIKI ,  SAKAGUCHI YOSHITAMI

IPC: H05B33/10 ,  G01R27/26 ,  G01R31/00 ,  G01R31/26 ,  G09F9/00 ,  G09F9/30 ,  G09G3/00 ,  G09G3/32 ,  H01L21/66 ,  H01L27/32 ,  H01L29/786 ,  H01L51/50 ,  H05B33/14

CPC classification number: G09G3/006 ,  G09G3/3225 ,  G09G2300/0842 ,  G09G2330/10

Abstract: PROBLEM TO BE SOLVED: To provide an inspection device and an inspection method of an active matrix panel capable of quickly determining open/short defect of a driving TFT in a TFT array for AMOLED panel before OLED forming process.
SOLUTION: The fabrication method of an active matrix OLED panel comprises an array process 1 of manufacturing an active matrix panel by forming a TFT array on a substrate, an inspection process 2 of performing function inspection of the manufactured active matrix panel and a cell process 3 of mounting an OLED to the active matrix panel passing through the inspection process 2. In the inspection process 2, the change of parasitic capacity across a pixel electrode when the driving TFT constituting the active matrix panel manufactured in the array process 1 is turned on and off is measured and the open/short of the driving TFT is inspected.
COPYRIGHT: (C)2005,JPO&NCIPI

公开(公告)号：JPH0884307A

公开(公告)日：1996-03-26

申请号：JP21121494

申请日：1994-09-05

Applicant: IBM

Inventor： KOBAYASHI YOSHINAO ,  SAKAGUCHI YOSHITAMI

IPC: H04N5/202 ,  G09G3/20 ,  G09G3/36 ,  H03M1/66 ,  H03M1/74 ,  H03M1/76 ,  H04N5/66

Abstract: PURPOSE: To enable high precision digital/analog(D/A) conversion of highly stable, precise gamma correction. CONSTITUTION: This device has; a decoder 1 which has plural output lines corresponding to the number of digits in digital data and generates outputs corresponding to the value of digital data on these output lines; a constant current source 9; an output means for obtaining an output voltage from a current supplied from the constant source 9; plural driving transistors respectively connected to one of plural output lines at the decoder 1 and connected to the constant current source 9 as well so as to allow a current to flow from the constant current source 9 when any connected output line is energized; and plural current limit transistors 11 connected to the plural driving transistors one by one. Then, the plural output lines at the decoder 1 are divided into groups corresponding to the respective areas of a gamma correction curve, and a reference voltage common for each group is applied to the control terminals of current limit transistors 11 related to the output lines in the respective groups.