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    ON-LINE MEASURING SYSTEM, DATUM CALIBRATING METHOD, DEVIATION MEASURING METHOD AND COMPUTER-READABLE MEDIUM
    1.
    发明申请
    ON-LINE MEASURING SYSTEM, DATUM CALIBRATING METHOD, DEVIATION MEASURING METHOD AND COMPUTER-READABLE MEDIUM 审中-公开

    公开(公告)号：US20190086199A1

    公开(公告)日：2019-03-21

    申请号：US15855794

    申请日：2017-12-27

    Applicant: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE

    Inventor： Po-Huang SHIEH ,  Po-Nien TSOU ,  Wei-Chieh CHANG ,  Ming-Cheng TSAI

    IPC: G01B11/25 ,  G01B11/02

    Abstract: An on-line measuring system, a datum calibrating method, a deviation measuring method and a computer-readable medium are provided. The datum calibrating method includes following steps. A work piece is scanned by a scanning unit to obtain a global point cloud data. A local CAD data of the work piece is obtained according to a predetermined range. A local CAD geometric feature of the local CAD data is obtained. A local point cloud data of the global point cloud data is obtained according to a local range corresponding to the predetermined range. A local scanning geometric feature of the local point cloud data is obtained. The local scanning geometric feature and the local CAD geometric feature are compared to obtain at least one spatial freedom limit. A system basis is obtained according to six spatial freedom limits, if the number of the at least one spatial freedom limit reaches six.

    SURFACE MEASURING DEVICE AND METHOD THEREOF
    2.
    发明申请
    SURFACE MEASURING DEVICE AND METHOD THEREOF 有权
    表面测量装置及其方法

    公开(公告)号：US20170059310A1

    公开(公告)日：2017-03-02

    申请号：US14934607

    申请日：2015-11-06

    Applicant: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE

    Inventor： Chia-Hung CHO ,  Kai-Ping CHUANG ,  Ming-Cheng TSAI

    IPC: G01B11/30

    CPC classification number: G01B11/303 ,  G01B21/04

    Abstract: A surface measuring device includes a rotary platform, a shifting lever, a measuring module, and a control module. The rotary platform carries an object under test and rotates the object under test at a rotating speed. The shifting lever is above the rotary platform. The measuring module disposed on the shifting lever moves to measurement positions on the shifting lever and performs a surface height measurement at a sampling frequency to sampling points on a surface of the object under test when located at one measurement position. The control module selectively adjusts the rotational speed for the rotary platform or the sampling frequency for the measuring module according to the measurement position of the measuring module on the shifting lever in order to fit a distance between the sampling points on at least one part of the surface of the object under test to a sampling rule.

    Abstract translation: 表面测量装置包括旋转平台，变速杆，测量模块和控制模块。 旋转平台承载待测物体，以转速旋转被测物体。 变速杆位于旋转平台的上方。 设置在变速杆上的测量模块移动到变速杆上的测量位置，并且当位于一个测量位置时，以采样频率对被测试物体的表面上的采样点进行表面高度测量。 控制模块根据测量模块在变速杆上的测量位置选择性地调节旋转平台的旋转速度或测量模块的采样频率，以便在至少一部分的采样点之间设置距离 被测物体的表面为抽样规则。

    FORMING METHOD OF PROCESSING CURVE IN STAMPING PROCESS
    3.
    发明公开
    FORMING METHOD OF PROCESSING CURVE IN STAMPING PROCESS 审中-公开

    公开(公告)号：US20240091838A1

    公开(公告)日：2024-03-21

    申请号：US17994761

    申请日：2022-11-28

    Applicant: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE

    Inventor： Po-Huang SHIEH ,  Hsuan-Yu HUANG ,  Ming-Cheng TSAI ,  Yi-Ping HUANG

    IPC: B21D22/02

    CPC classification number: B21D22/02

    Abstract: A forming method of a processing curve in a stamping process is provided. The method includes the following steps. A plurality of processing curves are established, and an optimization target is set for the processing curves according to material characteristics of a workpiece, process requirements and a finished product CAD file. At least two of the processing curves are selected and superimposed to form a basic forming curve, wherein each subsection of the basic forming curve corresponds to a selected processing curve. Whether the selected processing curve in each subsection of the basic forming curve matches the optimization target is determined.

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