公开(公告)号：US20150323505A1

公开(公告)日：2015-11-12

申请号：US14654647

申请日：2013-11-04

Applicant: KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE

Inventor： Dae Cheol Seo ,  Seung Hyun Cho ,  Choon Su Park ,  Seung Seok Lee ,  Young Min Seong

IPC: G01N29/24 ,  G01N29/14

CPC classification number: G01N29/2418 ,  G01N29/14 ,  G01N29/343 ,  G01N2291/02491 ,  G01N2291/0258 ,  G01N2291/101 ,  G01N2291/102

Abstract: The present invention relates to a technology for measuring a nonlinear parameter of an object to be measured, and more particularly, to an apparatus and method for measuring a nonlinear parameter of an object to be measured.

Abstract translation: 本发明涉及一种用于测量待测物体的非线性参数的技术，更具体地说，涉及一种用于测量待测物体的非线性参数的装置和方法。

公开(公告)号：US09829469B2

公开(公告)日：2017-11-28

申请号：US14654647

申请日：2013-11-04

Applicant: KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE

Inventor： Dae Cheol Seo ,  Seung Hyun Cho ,  Choon Su Park ,  Seung Seok Lee ,  Young Min Seong

IPC: G01N29/14 ,  G01N29/24 ,  G01N29/34

CPC classification number: G01N29/2418 ,  G01N29/14 ,  G01N29/343 ,  G01N2291/02491 ,  G01N2291/0258 ,  G01N2291/101 ,  G01N2291/102

Abstract: The present invention relates to a technology for measuring a nonlinear parameter of an object to be measured, and more particularly, to an apparatus and method for measuring a nonlinear parameter of an object to be measured.