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1.发明公开CALIBRATING FUNCTIONS OF AN INTEGRATED CIRCUIT AND STORING CALIBRATION PARAMETERS THEREOF IN A PROGRAMMABLE FUSE ARRAY 审中-公开集成电路为此必须在现场可编程FUSE校准功能和校准参数存储
公开(公告)号：EP1145123A2
公开(公告)日：2001-10-17
申请号：EP00913584.9
申请日：2000-02-23
Applicant: MICROCHIP TECHNOLOGY INC.
Inventor： SMIT, Willem , HOFHINE, Paul , ROGERS, Clark
IPC: G06F11/00
CPC classification number: H01L23/544 , H01L2223/5444 , H01L2223/54473 , H01L2924/0002 , H01L2924/00
Abstract: An integrated circuit having a microcontroller, mask programmed read only memory, functions such as clock oscillator, analog-to-digital converter, timers, etc., where each may be adjusted with a digital input to a desired calibration value. The digital input resulting in the desired calibration value being stored in a programmable fuse array.
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2.发明公开CALIBRATING FUNCTIONS OF AN INTEGRATED CIRCUIT AND STORING CALIBRATION PARAMETERS THEREOF IN A PROGRAMMABLE FUSE ARRAY 审中-公开集成电路为此必须在现场可编程FUSE校准功能和校准参数存储
公开(公告)号：EP1145123A3
公开(公告)日：2002-09-11
申请号：EP00913584.9
申请日：2000-02-23
Applicant: MICROCHIP TECHNOLOGY INC.
Inventor： SMIT, Willem , HOFHINE, Paul , ROGERS, Clark
IPC: G06F11/00
CPC classification number: H01L23/544 , H01L2223/5444 , H01L2223/54473 , H01L2924/0002 , H01L2924/00
Abstract: An integrated circuit having a microcontroller, mask programmed read only memory, functions such as clock oscillator, analog-to-digital converter, timers, etc., where each may be adjusted with a digital input to a desired calibration value. The digital input resulting in the desired calibration value being stored in a programmable fuse array.
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3.发明公开A MICROCONTROLLER HAVING SPECIAL MODE ENABLE DETECTION CIRCUITRY AND A METHOD OF OPERATION THEREFOR 审中-公开微控制器产生特殊“模式启用”检测电路包括用于操作DESSELBIGEN的一种方法
公开(公告)号：EP0948764A1
公开(公告)日：1999-10-13
申请号：EP98955168.0
申请日：1998-10-28
Applicant: MICROCHIP TECHNOLOGY INC.
Inventor： HULL, Richard , ELLISON, Scott , HOFHINE, Paul
CPC classification number: H03K19/1732 , G06F1/22
Abstract: A free-running microcontroller (i.e., one without any reset signal) is shown with special mode enable detect logic for placing the microcontroller into the test or special operations mode, without the benefit of a dedicated pin for such purposes. Rather, the instant invention implements the methodology of first applying a test voltage to indicate to the free-running microcontroller that the test mode is to be entered. Since the device has no reset signal to interrupt normal operation once it has begun, the test voltage is applied before the power supply VDD to ensure that the device enters test mode before it can enter normal operation.
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