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公开(公告)号:US20240071712A1
公开(公告)日:2024-02-29
申请号:US18226644
申请日:2023-07-26
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: SeungWan YOO , Jeongyeon LEE , Dohyung KIM , Jaehong PARK , Dong-Chan LIM
IPC: H01J37/20 , H01J37/317
CPC classification number: H01J37/20 , H01J37/3178 , H01J2237/201 , H01J2237/20214
Abstract: An ion beam deposition method includes placing a substrate into an ion beam deposition apparatus, irradiating an ion beam from an ion beam source toward a target plate, and rotating the target plate during the irradiating of the ion beam. The target plate includes a first region that includes a first material, and a second region that includes a second material different from the first material.
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2.
公开(公告)号:US20240062996A1
公开(公告)日:2024-02-22
申请号:US18234123
申请日:2023-08-15
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: SeungWan YOO , Jeongyeon LEE , Dohyung KIM , Jaehong PARK , Dong-Chan LIM
CPC classification number: H01J37/32697 , H01J37/3211 , C23C14/3442 , H01J37/34
Abstract: An ion beam source including a plasma chamber including a plasma generating space, a plasma generator configured to generate plasma in the plasma generating space, a first grid connected to the plasma chamber, a second grid connected to the plasma chamber, and a first grid driver connected to the first grid. The first grid driver may be configured to move the first grid relative to the second grid.
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