IMPROVED RAMAN SPECTROSCOPY SYSTEM
    1.
    发明申请
    IMPROVED RAMAN SPECTROSCOPY SYSTEM 审中-公开
    改进的拉曼光谱系统

    公开(公告)号:WO2016193315A3

    公开(公告)日:2017-01-05

    申请号:PCT/EP2016062398

    申请日:2016-06-01

    Applicant: SERSTECH AB

    Abstract: A spectroscopy system (10) for analyzing in-elastic scattered electromagnetic radiation from an object being irradiated by electromagnetic radiation is provided. The system comprises a tunable lens assembly (13) having a tunable lens provided in the beam path between an electromagnetic radiation source (11) and the object (0) and arranged to project a beam of electromagnetic radiation emitted from the electromagnetic radiation source onto an area of the object and receive and collimate the in-elastic scattered electromagnetic radiation from the object. Based on electromagnetic radiation detected by at least a first detector (121) a control unit (14) is capable making a decision to change the operational settings of the tunable lens.

    Abstract translation: 提供一种用于分析来自被电磁辐射照射的物体的弹性散射电磁辐射的光谱系统(10)。 该系统包括可调透镜组件(13),其具有设置在电磁辐射源(11)和物体(0)之间的光束路径中的可调透镜,并且布置成将从电磁辐射源发射的电磁辐射束投射到 物体的区域,并接收并准直来自物体的弹性散射电磁辐射。 基于由至少第一检测器(121)检测到的电磁辐射,控制单元(14)能够决定改变可调透镜的操作设置。

Patent Agency Ranking