Abstract:
PROBLEM TO BE SOLVED: To provide a method and an apparatus for inspecting a sample.SOLUTION: Disclosed is a method and an apparatus for inspecting a sample. The apparatus includes: a light source for generating excitation rays of light with a pulse to be continuously generated with an excitation pulse frequency for illuminating a sample area with the excitation pulse; and a detector for detecting detection rays of light to be emitted from the sample area. In the apparatus, the detector generates an electric pulse and an electric pulse sequence based on the electric pulse for each of the detection photons of the detection rays of light. The apparatus includes an analog/digital converter for generating a digital data sequence by sampling the electric pulse sequence at a sampling speed.
Abstract:
PROBLEM TO BE SOLVED: To provide a device for distributing illumination light and detection light in a microscope, and its method.SOLUTION: The device has a light distribution optical system 12 that guides illumination light 14 to a sample 18 and guides detection light 20 from the sample 18 to at least one of detectors. The light distribution optical system 12 comprises: polarization units 28, 30, and 32 arranged in a first optical path and configured to convert the illumination light 14 directed to the sample 18 into a first polarization state; a beam splitter 34 having such polarization dependability that while the illumination light 14 converted into the first polarization state is guided to the sample 18, a first portion 20a of detection light from the sample 18, which exhibits a first polarization state, is guided so as to return to the first optical path, a second portion 20b of the detection light, which has a second polarization state different from the first polarization state, is guided to a second optical path; and a beam combiner 38 configured to combine the first portion 20a and the second portion 20b of the detection light together and to guide the combined portions to the detector.
Abstract:
PROBLEM TO BE SOLVED: To improve a scanning microscope so that an optical microscope is able to perform imaging free from collision even in a difficult geometric condition.SOLUTION: In order to incline each illuminating focus (16, 84) with respect to the optical axis (O) of an illuminating optical system (10), a scanner (33) directs an illuminating light beam (12) to a partial area away from the pupil center of the incident pupil (14) of the illuminating optical system (10). Also, in order to move the illuminating focus (16, 84) over an illuminating target area, the scanner changes the direction of incidence of the illuminating light beam (12) within the partial area. An observation objective lens (38) spatially separated from the illuminating optical system (10) is provided. The observation objective lens (38) is arranged so that its optical axis (O) is located substantially perpendicular to the illuminating target area and so that this axis forms an acute angle (α) with respect to the optical axis (O) of the illuminating optical system (10).
Abstract:
PROBLEM TO BE SOLVED: To provide a method and an apparatus which image a sample with a scanning microscopy.SOLUTION: Disclosed are a method and an apparatus for imaging a sample (28) with a scanning microscopy. Multiple sample points are scanned with a scanning beam (14) in consecutive scanning time sections. An intensity of light emitted from each of the scanned sample points is sensed repeatedly within each of the related scanning time sections. Based on intensities sensed at each of the scanned sample points, an intensity average value is found as an average value image point signal. Then, by synthesizing such average value image point signals, an average value raster image signal is generated. Further, in addition, based on intensities sensed at each of the scanned sample points, an intensity variance value is found as a variance image point signal. Then, by synthesizing such variance image point signals, a variance raster image signal is generated.
Abstract:
PROBLEM TO BE SOLVED: To provide a device for focusing a microscope objective on a sample.SOLUTION: A device for focusing a microscope objective (26) on a sample (18) is disclosed. The device has a positioning unit (20) having: a main body (22); an objective holder (24) movably supported on the main body and adapted to hold the microscope objective (26); and an actuator (27) for moving the objective holder (24) along the optical axis (O) of the microscope objective. The objective holder holds the microscope objective (26) only at a front portion of the microscope objective facing the sample (18).
Abstract:
PROBLEM TO BE SOLVED: To provide a SPIM microscope with a STED light sheet.SOLUTION: A SPIM microscope (Selective Plane Imaging Microscopy) having a y-direction illumination light source and a z-direction detection light camera is disclosed. An x-scanner generates a sequential light sheet by scanning the illumination light beam in the x-direction. By optionally turning on a STED deactivation light beam, the light sheet can optionally be made thinner and therefore the optical resolution can be increased.
Abstract:
PROBLEM TO BE SOLVED: To provide a special-illumination surgical video stereomicroscope that employs special effects with simple illumination.SOLUTION: A special-illumination surgical video stereomicroscope of the present invention includes: at least one light source for illuminating an in-vivo specimen; and at least one video imaging unit for obtaining a fluorescence image of the specimen. The spectral sensitivity of the at least one video imaging unit exhibits a higher spectral sensitivity in at least one light wavelength range of a special radiation to be expected, for example, a fluorescence radiation, than in another light wavelength ranges.
Abstract:
PROBLEM TO BE SOLVED: To provide an image vibration proof device for the imaging system of a surgical microscope, which is excellent in space efficiency and has little response time.SOLUTION: An image vibration proof-imaging apparatus comprises: support substrates (101, 102; 201) for regulating sensor surfaces; a plurality of opto-electronic imaging cells (110; 210); and at least one of movement means (120; 220) for moving the opto-electronic imaging cells (110; 210) relative to the support substrates (101, 102; 201).
Abstract:
PROBLEM TO BE SOLVED: To provide a simple method for fundamentally improving temporal resolution and changing illumination conditions relating to a specimen. SOLUTION: In the method for scanning the specimen, by using illumination light beams emitted from at least one light source, a scanning process, wherein first scanning lines 21 are generated by scanning a desired portion of the specimen with illumination light beams of a first illumination condition, and then second scanning lines 22 are generated by scanning the desired portion with illumination light beams of a second illumination condition, is repeated several times, while changing the desired portion, and a first display 20a is acquired, based on a plurality of acquired first scanning lines 21, while a second display 20b is acquired based on a plurality of second scanning lines 22. COPYRIGHT: (C)2010,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a lighting device that can be made compact, as much as possible so as to prevent increase in the structural height of a microscope in an undesired mode, and that (completely) enables a more uniform illumination of the light field which is freer in vignetting than the conventional devices of this kind. SOLUTION: The lighting device for the microscope, in particular a surgical microscope, has at least one observation beam path. The lighting device includes an illumination system, and a deflection device 8 for deflecting light emitted from the illumination system onto an object to be observed, for example an eye to be operated on. The deflection device 8 performs an illumination of the object under various illumination angles, with regard to at least one observation beam path. The deflection device 8 includes two deflection elements (16, 17), each being at least partially a physical beam splitter. COPYRIGHT: (C)2009,JPO&INPIT