Abstract:
PROBLEM TO BE SOLVED: To provide a lithographic apparatus for reducing residual liquid left on the surface of a substrate, after exposure by a projection system. SOLUTION: The lithographic apparatus whose localized area of the substrate surface under a projection system PL is immersed in a liquid. By having the height of a liquid supply system 310 above the surface of a substrate W, the height can be varied by using actuators 314. A control system uses feedforward control or feedback control with input of the surface height of the substrate W, to maintain the liquid supply system 310 at a predetermined height above the surface of the substrate W. COPYRIGHT: (C)2008,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a method and apparatus for accurately aligning and/or leveling a substrate in an immersion lithography apparatus. SOLUTION: A map of the surface of a substrate is formed at a measurement station. Then the substrate is moved to the place of which space between a projection lens and the substrate is filled with liquid. Subsequently, the substrate is aligned with, for example, a transmission image sensor to expose exactly according to the map formed previously. In this way, the mapping is never carried out under an environment of liquid. COPYRIGHT: (C)2008,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a radiation source that actualizes an output level and a repetition rate suitable for manufacturing. SOLUTION: A radiation source comprises an anode and a cathode that are configured and arranged to create a discharge in a gas or a vapor in a space between the anode and cathode for forming a plasma so as to generate electromagnetic radiation. The gas or vapor may contain xenon, indium, lithium and/or tin. To improve heat dissipation, the radiation source comprises multiple plasma discharge elements, each of which is used only for short intervals. After one discharge element is used, another discharge element is selected. To improve an exact timing of pinch formation and thus that of pulse of EUV radiation, the radiation source comprises a triggering device. To improve conversion efficiency, the radiation source is configured to have a low inductance, and operates in a self-triggering mode. COPYRIGHT: (C)2008,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a lithographic projection apparatus which minimizes a liquid loss from a supply system during the exposure of ends of a substrate, in liquid immersion exposure. SOLUTION: Liquid is limited by a middle plate 210 located between the liquid supply system and the substrate W. Spaces 222, 215 among the middle plate 210, a transmitted image sensor (TIS) 220, and the substrate W are also filled with the liquid 111. This procedure can be performed by two separated space liquid-supply systems via holes 230, 240, or can be performed by the same space liquid-supply system via the holes 230, 240. Therefore, both the space 215 between the substrate W and the middle plate 210, and the space 225 between the transmitted image sensor 220 and the middle plate 210 are filled with the liquid, so that both the substrate W and the transmitted image sensor can be illuminated under the same condition. A part 200 provides one or a plurality of support surfaces with the middle plate 210 which can be held at a predetermined position by a vacuum source. COPYRIGHT: (C)2007,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide an electromagnetic actuator of high performance having a cooling structure for reducing a temperature change in a permanent magnet structure of the actuator. SOLUTION: The lithography apparatus has a patterning supporter constituted so as to support a patterning device and a substrate supporter constituted so as to support a substrate. At least one of the patterning supporter and the substrate supporter is moved by the electromagnetic actuator. The actuator has a first part and a second part relatively movable to each other. The first part has a coil structure, and the second part includes a plurality of permanent magnets acting each other with the coil structure. The second part is provided with a cooling structure arranged adjoining to the permanent magnet. A cooling duct is arranged between the adjacent permanent magnets or on one surface of the permanent magnet facing the coil structure. COPYRIGHT: (C)2007,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a lithographic apparatus that has high resolution, can be configured at low costs, and performs processing at high speed for increased productivity in imprint lithography. SOLUTION: A method comprises a step of redistributing an imprintable medium, that is in a flowable state over a target portion of a surface of a substrate, to regions of differing volume corresponding to regions of differing pattern density in an imprint pattern of a template; a step of bringing the medium into contact with the template while the medium is in a flowable state, so as to form the imprint pattern in the medium; a step of conditioning the medium so that the medium changes into a substantially non-flowable state; and a step of separating the template from the medium that is in the substantially non-flowable state. Immediately prior to bringing the medium into contact with the template, an appropriately designed redistribution stamp is impressed onto the medium to redistribute the medium. COPYRIGHT: (C)2006,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide a lithographic apparatus and a device manufacturing method. SOLUTION: A final element in an immersion lithographic apparatus is disclosed. The final element has, on a surface closest to a substrate, a layer bonded to the surface, and comprises an edge barrier which is made of the same material as that of the layer and extends from the layer so as to be away from the substrate for shielding the final element from a liquid. In an embodiment, the final element is attached to the apparatus via the layer and/or the edge barrier, which can be made of a material having a thermal expansion coefficient smaller than that of the final element. COPYRIGHT: (C)2006,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide a lithographic device provided with a projection column having a gas-regulated environment that is hardly affected by the fluctuation of an ambient atmosphere. SOLUTION: The lithographic device is disclosed. The lithographic device includes a projection system configured to project a patternized radiation beam on the target portion of a substrate. The projection system includes a housing and a plurality of optical elements disposed in the housing. In addition, the lithographic device includes an inlet for supplying a regulated gas to the housing and a gas discharge section for discharging the regulated gas from the housing to create the gas-regulated environment. At least one gate for making the gas-regulated environment communicate with the ambient atmosphere is disposed. The gate is disposed to perform the predetermined leakage of the regulated gas to the ambient atmosphere. COPYRIGHT: (C)2006,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide a lithography apparatus and a device manufacturing method. SOLUTION: The lithography projection apparatus, whose liquid supplying system supplies a dipping liquid between the last element of the projection apparatus and a substrate, is disclosed. An active dry station is located to remove the dipping liquid from the substrate W or the other object actively after dipping the substrate. COPYRIGHT: (C)2006,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide a lithographic apparatus, an alignment apparatus, a device manufacture method, an alignment method, and an apparatus change method. SOLUTION: By a detector, the amount of liquid in the optical path of projection beams or alignment beams is detected and then by a controller, an optical element required for focusing the projection beams or the alignment beams onto the surface of a substrate from among a plurality of compensating optical elements is determined. An appropriate optical element is arranged directly in the optical path of the projection beams or the alignment beams as a final element for the projection system or the projection alignment system. COPYRIGHT: (C)2005,JPO&NCIPI