Abstract:
PROBLEM TO BE SOLVED: To provide a pulse delay circuit capable of improving performance of an A/D conversion circuit and a time measurement circuit without depending on sophistication of process technology; its drive method; and an A/D conversion circuit and a time measurement circuit using it. SOLUTION: An inverter circuit INV configuring a delay unit DU is a so-called CMOS transistor comprising a PMOS transistor Tp and an NMOS transistor Tn of which the gates G are interconnected with each other and the drains D are interconnected with each other. The source S and a back gate B of the NMOS transistor Tn are connected to a negative electrode drive terminal 105 (that is the ground). The source S of the PMOS transistor Tp is connected to a positive electrode drive terminal 103 (that is, an analog input signal Vin is applied thereto). The back gate B of the PMOS transistor Tp is connected to a control terminal 107 (that is, a fixed voltage VDD as a control signal is applied thereto). COPYRIGHT: (C)2009,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a radio controlled clock which verifies time information reconstructed from standard radio wave in a short period of time. SOLUTION: Regarding the phase ϕ N, m of a carrier wave (carrier) of a long-wave standard radio wave calculated by a phase arithmetic circuit 23, based on the same phase component and orthogonal component generated by an orthogonal detection circuit 18, a dispersion arithmetic circuit 24 finds the dispersion from the reference phase varying at a time variation proportional to the error ε of a reference signal CK2. When the dispersion is an allowance or less, a time verifying circuit 26 determines that the receiving state (S/N) of the carrier is good, and determines the possibility of correction of the clock time according to the verifying result of the time information obtained from a single frame. When the dispersion is more than the allowance, the time verifying circuit 26 determines that the receiving state of the carrier is bad, and prohibits the correction of the clock time regardless of the verifying result of the time information. COPYRIGHT: (C)2007,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide an A/D conversion circuit in a TAD system whose characteristics are stable for suppressing the influence of any working error or fine dust relatively increasing according to the microfabrication of a CMOS manufacturing process. SOLUTION: A transistor (see figure (a)) configuring a pulse delay circuit is compared with a transistor (see (b)) configuring a latch & encoder 12, and transistor length (pattern width of gate Gp, Gn) L is designed so as to be doubled (that is, the minimum line width of a design rule is doubled), and the transistor width is designed so as to be doubled. In this case, a contact window Co as the connection point of a wiring pattern is formed of the minimum line width in any circuit, and the pattern width (width in a direction following transistor length L) of drains Dp, Dn or sources Sp, Sn whose size is specified according to the size of the contact window Co is designed so as to be turned into the necessary minimum size. COPYRIGHT: (C)2007,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To reduce the power consumption of an A/D conversion circuit using a pulse delay circuit. SOLUTION: This A/D conversion circuit 1 is provided with a ring gate delay circuit (RGD) 10 obtained by connecting inversion circuits in a ring shape as a pulse delay circuit, and in the RGD 10, the voltage signal Vin of an A/D conversion object is applied as power supply voltage and the circling time of a pulse signal changes in accordance with the voltage signal Vin. Then, an encoding processing block 3 detects the number of stages of inversion circuits where a pulse signal has passed through in the RGD 10 within a certain set time, data DO1 representing the number of stages is outputted as an A/D conversion result of the voltage signal Vin, but especially, the input ranges of power supply voltage VDDL of the encoding processing block 3 and the voltage signal Vin are set equal to or below (¾ Vthn ¾ + ¾ Vthp ¾). In addition, the Vthn and Vthp are respective threshold voltages of an n channel transistor and a p channel transistor of gate circuits constituting circuits 3 and 10. COPYRIGHT: (C)2005,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide a filtering method by which an unnecessary high frequency signal component unable to be eliminated by a digital moving average filter can be attenuated without the need for a CR filter and to provide an analog/ digital converter with a filtering function. SOLUTION: An analog moving average filter 2 is provided to a first stage of the analog/digital converter provided with an analog/digital converter 4 and a high frequency signal component eliminating digital moving average filter 6, and sampling frequencies of the filters 6, 2 are set to be fsd=n×fsa (n is a positive integer: 1, 2, etc.). As a result, an unnecessary signal pass band from the filter 6 appearing at frequencies of a multiple of n of the sampling frequency fsd is overlapped with a region with an infinite attenuation appearing at frequencies of a multiple of n of the sampling frequency fsa at the filter 2 and the entire device can efficiently attenuate the unnecessary high frequency signal component. Further, the similar effect can be obtained by using a temporal analog/digital converter in place of the analog moving average filter 2 and the analog/digital converter 4.
Abstract:
PROBLEM TO BE SOLVED: To provide a shift clock generating unit, which is capable of generating shift clock that is shifted from a reference clock by a prescribed phase difference, without using the clock that has a period which corresponds to the phase difference. SOLUTION: A shift clock generating unit 20 is equipped with delay lines connected to delay units 80(1) to 80(k) composed of gate circuits, switches SWb to SWh connected to the outputs of the delay units, and decoders 90b to 90h which take out shift clocks CKb to CKh obtained by delaying the reference clock by a desired time, by turning on a specific switch from among the switches SWb to SWh. Control data CD used for enabling the reference clock generating unit (digital PLL) to generate the reference clock are inputted into the decoders as period data CD representing the period of the reference clock MCK, and the decoders decide a specific switch selected from among the switch group to be turned, on the basis of the period data.
Abstract:
PROBLEM TO BE SOLVED: To attain the coincidence of time resolution at every pulse generating circuit when the plural pulse generating circuits respectively generate a pulse signal by a prescribed timing through the use of delay signals which are successively outputted from the prescribed connection point of delay elements. SOLUTION: The pulse signals P1 are successively outputted from one digital control oscillation circuit 64 by a fixed period corresponding to control data Da and the pulse signals P2 where a phase is deviated as against the period are successively outputted from the other digital control oscillation circuit 66 by the period being the same as that of the pulse signal P1. The pulse signal P0 with a duty ratio corresponding to the deviation of the phases of the pulse signals P1 and P2 is outputted from an RS flip-flop 68. Since the respective digital control oscillation circuits 64 and 66 share a ring oscillator 62, their time resolutions perfectly coincide each other and the period of the pulse signal P0 from the RS flip-flop 68 and the duty ratio are controlled with high precision.
Abstract:
PROBLEM TO BE SOLVED: To provide a time measuring apparatus which can measure a time interval between each of a plurality of signals to be measured and a measurement reference signal and hold each measuring result even when the plurality of signals are generated at considerably close time points each other. SOLUTION: The apparatus is provided with four signal-processing parts 6a-6d. Each processing part 6a-6d takes in a delay signal DY0-DYn output in accordance with a transmission position of a measurement start signal PA from a signal delay line 4 which delays and transmits the measurement start signal PA, with a timing of a measurement end signal PBi (i=1-4), and outputs digital data corresponding to a time interval of the signals PA and PBi as a measuring value DAi. Since the signal PBi and measuring value DAi are input/output through respective individual signal lines, the signals PBi never interfere with each other at however close time points the signals PBi are generated. Neither the measuring value DAi is rewritten subsequent to a succeeding measurement.
Abstract:
PROBLEM TO BE SOLVED: To easily eliminate an electron which is trapped by the interface of two insulation films by applying such electromagnetic wave as ultraviolet ray to the interface between a second insulation film and a first insulation film in a process after the second insulation film is formed. SOLUTION: Ion is implanted to a specific region of a silicon substrate 10 to form a drain region 11, a source region 12, and conductive layers 17 and 18. Then, only a sacrifice layer is eliminated by etching and 5,000Å gap 20 is formed between a movable member 15 and the surface of the silicon substrate 10. At this time, Si3 N4 film 14 prevents SiO2 film 13 from being etched. Then, ultraviolet rays are uniformly applied to the surface of the Si3 N4 film 14 for at least 40 minutes via the movable member 15 using a mercury lamp. When the Si3 N4 film 14 is 500Å thick, an electron which is trapped at an interface level can be completely eliminated by applying ultraviolet rays for at least 40 minutes.